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Journal Articles
- 2018
[j7]Laurent Artola
, Ahmad Al Youssef, Samuel Ducret, Franck Perrier, Raphael Buiron, Olivier Gilard, Julien Mekki, Mathieu Boutillier, Guillaume Hubert, Christian Poivey:
Update of Single Event Effects Radiation Hardness Assurance of Readout Integrated Circuit of Infrared Image Sensors at Cryogenic Temperature. Sensors 18(7): 2338 (2018)- 2015
- [j6]Jérémy Michaud, Guillaume Pedroza, Laurent Béchou, L. S. How, Olivier Gilard, David Veyrié, F. Laruelle, Stéphane Grauby:
Investigations on electro-optical and thermal performances degradation of high power density GaAs-based laser diode in vacuum environment. Microelectron. Reliab. 55(9-10): 1746-1749 (2015) - 2011
- [j5]Piero Spezzigu, Laurent Béchou, Gianandrea Quadri, Olivier Gilard, Yves Ousten, Massimo Vanzi:
An original DoE-based tool for silicon photodetectors EoL estimation in space environments. Microelectron. Reliab. 51(9-11): 1999-2003 (2011) - 2010
- [j4]David Veyrié, Olivier Gilard, Kevin Sanchez, Sébastien Lhuillier, Frédéric Bourcier:
New methodology for the assessment of the thermal resistance of laser diodes and light emitting diodes. Microelectron. Reliab. 50(4): 456-461 (2010) - 2008
- [j3]M. L. Bourqui, Laurent Béchou, Olivier Gilard, Yannick Deshayes, Pamela Del Vecchio, L. S. How, F. Rosala, Yves Ousten, André Touboul:
Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications. Microelectron. Reliab. 48(8-9): 1202-1207 (2008) - [j2]A. Gauffier, Jean-Pierre David, Olivier Gilard:
Analytical model for multi-junction solar cells prediction in space environment. Microelectron. Reliab. 48(8-9): 1494-1499 (2008) - 2006
- [j1]Mathieu Boutillier, Olivier Gauthier-Lafaye, S. Bonnefont, F. Lozes-Dupuy, F.-J. Vermersch, M. Krakowski, Olivier Gilard:
Strong electron irradiation hardness of 852 nm Al-free laser diodes. Microelectron. Reliab. 46(9-11): 1715-1719 (2006)
Coauthor Index
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