default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDJordi Suñé
Person information
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2020 – today
- 2021
[c3]Fernando L. Aguirre
, Sebastián Matías Pazos, Felix Palumbo, N. Gomez, Enrique Miranda, Jordi Suñé:
Line Resistance Impact in Memristor-based Multi Layer Perceptron for Pattern Recognition. LASCAS 2021: 1-4- 2020
- [j16]Fernando Leonel Aguirre, Sebastián Matías Pazos, Felix Palumbo, Jordi Suñé, Enrique Miranda:
Application of the Quasi-Static Memdiode Model in Cross-Point Arrays for Large Dataset Pattern Recognition. IEEE Access 8: 202174-202193 (2020)
2010 – 2019
- 2018
- [j15]German Agustin Patterson, Jordi Suñé, Enrique Miranda:
SPICE simulation of memristive circuits based on memdiodes with sigmoidal threshold functions. Int. J. Circuit Theory Appl. 46(1): 39-49 (2018) - [j14]Alberto Rodriguez-Fernandez, J. Muñoz-Gorriz, Jordi Suñé, Enrique Miranda:
A new method for estimating the conductive filament temperature in OxRAM devices based on escape rate theory. Microelectron. Reliab. 88-90: 142-146 (2018) - 2017
- [j13]Alberto Rodriguez-Fernandez, Carlo Cagli, Luca Perniola, Jordi Suñé, Enrique Miranda:
Identification of the generation/rupture mechanism of filamentary conductive paths in ReRAM devices using oxide failure analysis. Microelectron. Reliab. 76-77: 178-183 (2017) - [j12]German Agustin Patterson, Jordi Suñé, Enrique Miranda:
Voltage-Driven Hysteresis Model for Resistive Switching: SPICE Modeling and Circuit Applications. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(12): 2044-2051 (2017) - [c2]Enrique Miranda, Jordi Suñé, Chengbin Pan, Marco A. Villena, Na Xiao, Mario Lanza:
Equivalent circuit model for the electron transport in 2D resistive switching material systems. ESSDERC 2017: 86-89 - 2015
- [j11]Juli Blasco, Nestor Fabian Ghenzi, Jordi Suñé, Pablo Levy, Enrique Miranda:
Equivalent circuit modeling of the bistable conduction characteristics in electroformed thin dielectric films. Microelectron. Reliab. 55(1): 1-14 (2015) - [j10]Alberto Rodriguez-Fernandez, M. B. González, Francesca Campabadal, Jordi Suñé, Enrique Miranda:
Electrical characterization of multiple leakage current paths in HfO2/Al2O3-based nanolaminates. Microelectron. Reliab. 55(9-10): 1442-1445 (2015) - [c1]Juli Blasco, Jordi Suñé, Enrique Miranda:
Modeling of the conduction characteristics of voltage-driven bipolar RRAMs including turning point effects. ESSDERC 2015: 44-47 - 2014
- [j9]Juli Blasco, Helena Castán, Héctor García, Salvador Dueñas, Jordi Suñé, Marianna Kemell, Kaupo Kukli, Mikko Ritala, Markku Leskelä, Enrique Miranda:
Single-parameter model for the post-breakdown conduction characteristics of HoTiOx-based MIM capacitors. Microelectron. Reliab. 54(9-10): 1707-1711 (2014) - 2013
- [j8]X. Saura, D. Moix, Jordi Suñé, Paul K. Hurley, Enrique Miranda:
Direct observation of the generation of breakdown spots in MIM structures under constant voltage stress. Microelectron. Reliab. 53(9-11): 1257-1260 (2013) - [j7]X. Saura, X. Lian, David Jiménez, Enrique Miranda, Xavier Borrisé, Francesca Campabadal, Jordi Suñé:
Field-effect control of breakdown paths in HfO2 based MIM structures. Microelectron. Reliab. 53(9-11): 1346-1350 (2013) - 2012
- [j6]Enrique Miranda, Takamasa Kawanago, Kuniyuki Kakushima, Jordi Suñé, Hiroshi Iwai:
Analysis and modeling of the gate leakage current in advanced nMOSFET devices with severe gate-to-drain dielectric breakdown. Microelectron. Reliab. 52(9-10): 1909-1912 (2012)
2000 – 2009
- 2005
- [j5]Ernest Y. Wu, Jordi Suñé:
Power-law voltage acceleration: A key element for ultra-thin gate oxide reliability. Microelectron. Reliab. 45(12): 1809-1834 (2005) - 2004
- [j4]Enrique Miranda, Jordi Suñé:
Electron transport through broken down ultra-thin SiO2 layers in MOS devices. Microelectron. Reliab. 44(1): 1-23 (2004) - 2003
- [j3]Ernest Y. Wu, Jordi Suñé, Wing L. Lai, Alex Vayshenker, Edward J. Nowak, David L. Harmon:
Critical reliability challenges in scaling SiO2-based dielectric to its limit. Microelectron. Reliab. 43(8): 1175-1184 (2003) - [j2]Jordi Suñé, Ernest Y. Wu, David Jiménez, Wing L. Lai:
Statistics of soft and hard breakdown in thin SiO2 gate oxides. Microelectron. Reliab. 43(8): 1185-1192 (2003) - 2001
- [j1]Xavier Oriols, Jordi Suñé:
Study of Electronic Transport in Tunneling Devices Using an Incoherent Superposition of Time Dependent Wave Packets. VLSI Design 13(1-4): 145-148 (2001)
Coauthor Index
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from 
to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the 
of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from 
, 
, and 
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from 
.
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-04-24 22:59 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
