"A new method for estimating the conductive filament temperature in OxRAM ..."

Alberto Rodriguez-Fernandez et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.06.120

access: closed

type: Journal Article

metadata version: 2021-09-20

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Alberto Rodriguez-Fernandez, J. Muñoz-Gorriz, Jordi Suñé, Enrique Miranda:
A new method for estimating the conductive filament temperature in OxRAM devices based on escape rate theory. Microelectron. Reliab. 88-90: 142-146 (2018)

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