"Single-parameter model for the post-breakdown conduction characteristics ..."

Juli Blasco et al. (2014)

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DOI: 10.1016/J.MICROREL.2014.07.067

access: closed

type: Journal Article

metadata version: 2020-02-22

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Juli Blasco, Helena Castán, Héctor García, Salvador Dueñas, Jordi Suñé, Marianna Kemell, Kaupo Kukli, Mikko Ritala, Markku Leskelä, Enrique Miranda:
Single-parameter model for the post-breakdown conduction characteristics of HoTiO_x-based MIM capacitors. Microelectron. Reliab. 54(9-10): 1707-1711 (2014)

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