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M. B. González
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2020 – today
- 2023
- [j6]Maryam Akbari, Sattar Mirzakuchaki, Daniel Arumí, Salvador Manich, Álvaro Gómez-Pau, Francesca Campabadal, Mireia Bargallo González, Rosa Rodríguez-Montañés:
True Random Number Generator Based on the Variability of the High Resistance State of RRAMs. IEEE Access 11: 66682-66693 (2023) - [j5]Juan Bautista Roldán, Enrique Miranda, David Maldonado, Alexey N. Mikhaylov, Nikolay V. Agudov, Alexander A. Dubkov, Maria N. Koryazhkina, Mireia Bargallo González, Marco A. Villena, Samuel Poblador, Mercedes Saludes-Tapia, Rodrigo Picos, Francisco Jiménez-Molinos, Stavros G. Stavrinides, Emili Salvador, Francisco J. Alonso, Francesca Campabadal, Bernardo Spagnolo, Mario Lanza, Leon O. Chua:
Variability in Resistive Memories. Adv. Intell. Syst. 5(6) (2023) - 2022
- [c5]David Maldonado, Francisco Jiménez-Molinos, Juan Bautista Roldán, M. B. González, Francesca Campabadal:
An enhanced Verilog-A compact model for bipolar RRAMs including transient thermal effects and series resistance. DCIS 2022: 1-6 - 2021
- [c4]Binbin Yang, Daniel Arumí, Salvador Manich, Álvaro Gómez-Pau, Rosa Rodríguez-Montañés, Juan Bautista Roldán, Mireia Bargallo González, Francesca Campabadal, Liang Fang:
Simulation of serial RRAM cell based on a Verilog-A compact model. DCIS 2021: 1-6 - 2020
- [c3]Gerardo González-Cordero, M. B. González, Francesca Campabadal, Francisco Jiménez-Molinos, Juan Bautista Roldán:
A physically based SPICE model for RRAMs including RTN. DCIS 2020: 1-6 - [c2]Mireia Bargallo González, Marcos Maestro-Izquierdo, Francesca Campabadal, Samuel Aldana, Francisco Jiménez-Molinos, Juan Bautista Roldán:
Impact of Intrinsic Series Resistance on the Reversible Dielectric Breakdown Kinetics in HfO2 Memristors. IRPS 2020: 1-4
2010 – 2019
- 2018
- [c1]Marta Pedro, Javier Martín-Martínez, E. Miranda, Rosana Rodríguez, Montserrat Nafría, M. B. González, Francesca Campabadal:
Device variability tolerance of a RRAM-based self-organizing neuromorphic system. IRPS 2018: 4-1 - 2015
- [j4]Alberto Rodriguez-Fernandez, M. B. González, Francesca Campabadal, Jordi Suñé, Enrique Miranda:
Electrical characterization of multiple leakage current paths in HfO2/Al2O3-based nanolaminates. Microelectron. Reliab. 55(9-10): 1442-1445 (2015) - 2013
- [j3]Joan Marc Rafí, M. B. González, Kenichiro Takakura, I. Tsunoda, M. Yoneoka, Oihane Beldarrain, Miguel Zabala, Francesca Campabadal:
2 MeV electron irradiation effects on the electrical characteristics of MOS capacitors with ALD Al2O3 dielectrics of different thickness. Microelectron. Reliab. 53(9-11): 1333-1337 (2013) - 2012
- [j2]Nuria Ayala, Javier Martín-Martínez, Rosana Rodríguez, M. B. González, Montserrat Nafría, Xavier Aymerich, Eddy Simoen:
Characterization and SPICE modeling of the CHC related time-dependent variability in strained and unstrained pMOSFETs. Microelectron. Reliab. 52(9-10): 1924-1927 (2012) - 2010
- [j1]Javier Martín-Martínez, Esteve Amat, M. B. González, P. Verheyen, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich, Eddy Simoen:
SPICE modelling of hot-carrier degradation in Si1-xGex S/D and HfSiON based pMOS transistors. Microelectron. Reliab. 50(9-11): 1263-1266 (2010)
Coauthor Index
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