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2020 – today
- 2023
[j10]Maryam Akbari
, Sattar Mirzakuchaki, Daniel Arumí, Salvador Manich, Álvaro Gómez-Pau, Francesca Campabadal, Mireia Bargallo González, Rosa Rodríguez-Montañés:
True Random Number Generator Based on the Variability of the High Resistance State of RRAMs. IEEE Access 11: 66682-66693 (2023)- 2022
- [c11]V. Mahboubi, Daniel Arumí, Álvaro Gómez-Pau, Rosa Rodríguez-Montañés, Salvador Manich:
On the Fitting and Improvement of RRAM Stanford-Based Model Parameters Using TiN/Ti/HfO2/W Experimental Data. DCIS 2022: 1-6 - 2021
- [j9]Jordi-Roger Riba, Álvaro Gómez-Pau, Jimmy Arturo Martinez, Manuel Moreno-Eguilaz:
On-Line Remaining Useful Life Estimation of Power Connectors Focused on Predictive Maintenance. Sensors 21(11): 3739 (2021) - [c10]P. Albiol, Salvador Manich, Daniel Arumí, Rosa Rodríguez-Montañés, Álvaro Gómez-Pau:
Low Cost AES Protection Against DPA Using Rolling Codes. DCIS 2021: 1-6 - [c9]Binbin Yang, Daniel Arumí, Salvador Manich, Álvaro Gómez-Pau, Rosa Rodríguez-Montañés, Juan Bautista Roldán, Mireia Bargallo González, Francesca Campabadal, Liang Fang:
Simulation of serial RRAM cell based on a Verilog-A compact model. DCIS 2021: 1-6 - 2020
- [j8]Álvaro Gómez-Pau, Emili Lupon, Luz Balado, Joan Figueras:
Indirect and adaptive test of analogue circuits based on preselected steady-state response measures. IET Circuits Devices Syst. 14(5): 611-618 (2020) - [j7]Jordi-Roger Riba, Álvaro Gómez-Pau, Manuel Moreno-Eguilaz:
Experimental Study of Visual Corona under Aeronautic Pressure Conditions Using Low-Cost Imaging Sensors. Sensors 20(2): 411 (2020) - [j6]Jordi-Roger Riba, Álvaro Gómez-Pau, Manuel Moreno-Eguilaz, Santiago Bogarra:
Arc Tracking Control in Insulation Systems for Aeronautic Applications: Challenges, Opportunities, and Research Needs. Sensors 20(6): 1654 (2020) - [j5]Jordi-Roger Riba, Álvaro Gómez-Pau, Manuel Moreno-Eguilaz:
Insulation Failure Quantification Based on the Energy of Digital Images Using Low-Cost Imaging Sensors. Sensors 20(24): 7219 (2020) - [c8]Gabriel Rojas-Dueñas, Jordi-Roger Riba, Khaled Kahalerras, Manuel Moreno-Eguilaz, Akash Kadechkar, Álvaro Gómez-Pau:
Black-Box Modelling of a DC-DC Buck Converter Based on a Recurrent Neural Network. ICIT 2020: 456-461
2010 – 2019
- 2017
- [j4]Álvaro Gómez-Pau, Luz Balado, Joan Figueras:
Multi-Directional Space Tessellation to Improve the Decision Boundary in Indirect Mixed-Signal Testing. J. Electron. Test. 33(3): 315-328 (2017) - 2016
- [j3]Álvaro Gómez-Pau, Luz Balado, Joan Figueras:
Indirect test of M-S circuits using multiple specification band guarding. Integr. 55: 415-424 (2016) - [j2]Álvaro Gómez-Pau, Luz Balado, Joan Figueras:
Efficient Production Binning Using Octree Tessellation in the Alternate Measurements Space. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(8): 1386-1395 (2016) - 2015
- [c7]Álvaro Gómez-Pau, Luz Balado, Joan Figueras:
Analog circuits testing using digitally coded indirect measurements. DTIS 2015: 1-6 - 2014
- [j1]Elena I. Vatajelu, Álvaro Gómez-Pau, Michel Renovell, Joan Figueras:
Sram cell stability metric under transient voltage noise. Microelectron. J. 45(10): 1348-1353 (2014) - [c6]Suvadeep Banerjee, Álvaro Gómez-Pau, Abhijit Chatterjee, Jacob A. Abraham:
Error Resilient Real-Time State Variable Systems for Signal Processing and Control. ATS 2014: 39-44 - [c5]Suvadeep Banerjee, Álvaro Gómez-Pau, Abhijit Chatterjee:
Design of low cost fault tolerant analog circuits using real-time learned error compensation. ETS 2014: 1-2 - [c4]Álvaro Gómez-Pau, Luz Balado, Joan Figueras:
M-S specification binning based on digitally coded indirect measurements. ETS 2014: 1-6 - [c3]Álvaro Gómez-Pau, Suvadeep Banerjee, Abhijit Chatterjee:
Real-time transient error and induced noise cancellation in linear analog filters using learning-assisted adaptive analog checksums. IOLTS 2014: 25-30 - 2013
- [c2]Álvaro Gómez-Pau, Luz Balado, Joan Figueras:
M-S test based on specification validation using octrees in the measure space. ETS 2013: 1-6 - 2011
- [c1]Elena I. Vatajelu, Álvaro Gómez-Pau, Michel Renovell, Joan Figueras:
Transient Noise Failures in SRAM Cells: Dynamic Noise Margin Metric. Asian Test Symposium 2011: 413-418
Coauthor Index
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