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Mohab Anis
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2010 – 2019
- 2016
- [j43]Ayman Yehia Hamouda, Mohab Anis, Karim S. Karim:
Model-Based Initial Bias (MIB): Toward a Single-Iteration Optical Proximity Correction. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(10): 1630-1639 (2016) - [c48]Kareem Madkour, Sarah Mohamed, Dina Tantawy, Mohab Anis:
Hotspot detection using machine learning. ISQED 2016: 405-409 - 2014
- [c47]Hassan Mostafa
, Mohab Anis, Mohamed I. Elmasry:
Negative capacitance circuits for process variations compensation and timing yield improvement. CCECE 2014: 1-4 - 2013
- [j42]Hassan Mostafa
, Mohab Anis, Mohamed I. Elmasry:
Statistical SRAM Read Access Yield Improvement Using Negative Capacitance Circuits. IEEE Trans. Very Large Scale Integr. Syst. 21(1): 92-101 (2013) - [c46]Hassan Mostafa
, Mohab Anis, Mohamed I. Elmasry:
Negative capacitance circuits for process variations compensation and timing yield improvement. ICECS 2013: 277-280 - [c45]Esraa Swillam, Kareem Madkour, Mohab Anis:
Layout regularity metric as a fast indicator of high variability circuits. SoCC 2013: 43-48 - 2012
- [j41]Kian Haghdad, Javid Jaffari, Mohab Anis:
Power grid analysis and verification considering temperature variations. Microelectron. J. 43(3): 189-197 (2012) - [j40]Kian Haghdad, Mohab Anis:
Timing yield analysis considering process-induced temperature and supply voltage variations. Microelectron. J. 43(12): 956-961 (2012) - [j39]Hassan Mostafa
, Mohab Anis, Mohamed I. Elmasry:
On-Chip Process Variations Compensation Using an Analog Adaptive Body Bias (A-ABB). IEEE Trans. Very Large Scale Integr. Syst. 20(4): 770-774 (2012) - [j38]Kian Haghdad, Mohab Anis:
Power Yield Analysis Under Process and Temperature Variations. IEEE Trans. Very Large Scale Integr. Syst. 20(10): 1794-1803 (2012) - [c44]Ayman Yehia Hamouda, Mohab Anis, Karim S. Karim:
AIR (Aerial Image Retargeting): A novel technique for in-fab automatic model-based retargeting-for-yield. DATE 2012: 1603-1608 - 2011
- [j37]Kian Haghdad, Mohab Anis, Yehea I. Ismail:
Floorplanning for low power IC design considering temperature variations. Microelectron. J. 42(1): 89-95 (2011) - [j36]Javid Jaffari, Mohab Anis:
On Efficient LHS-Based Yield Analysis of Analog Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(1): 159-163 (2011) - [j35]Hassan Mostafa
, Mohab Anis, Mohamed I. Elmasry:
Novel Timing Yield Improvement Circuits for High-Performance Low-Power Wide Fan-In Dynamic OR Gates. IEEE Trans. Circuits Syst. I Regul. Pap. 58-I(8): 1785-1797 (2011) - [j34]Mohab Anis, Howard C. Luong
, Gabriele Manganaro
:
Guest Editorial Special Section on 2010 IEEE Custom Integrated Circuits Conference (CICC 2010). IEEE Trans. Circuits Syst. I Regul. Pap. 58-I(9): 1993-1995 (2011) - [j33]Kian Haghdad, Mohab Anis:
Power Supply Pads Assignment for Maximum Timing Yield. IEEE Trans. Circuits Syst. II Express Briefs 58-II(10): 697-701 (2011) - [j32]Hassan Mostafa
, Mohab Anis, Mohamed I. Elmasry:
Adaptive Body Bias for Reducing the Impacts of NBTI and Process Variations on 6T SRAM Cells. IEEE Trans. Circuits Syst. I Regul. Pap. 58-I(12): 2859-2871 (2011) - [j31]Hassan Mostafa
, Mohab Anis, Mohamed I. Elmasry:
Analytical Soft Error Models Accounting for Die-to-Die and Within-Die Variations in Sub-Threshold SRAM Cells. IEEE Trans. Very Large Scale Integr. Syst. 19(2): 182-195 (2011) - [j30]Akhilesh Kumar, Mohab Anis:
IR-Drop Aware Clustering Technique for Robust Power Grid in FPGAs. IEEE Trans. Very Large Scale Integr. Syst. 19(7): 1181-1191 (2011) - [j29]Hassan Mostafa
, Mohab Anis, Mohamed I. Elmasry:
A Novel Low Area Overhead Direct Adaptive Body Bias (D-ABB) Circuit for Die-to-Die and Within-Die Variations Compensation. IEEE Trans. Very Large Scale Integr. Syst. 19(10): 1848-1860 (2011) - [j28]Hassan Mostafa
, Mohab Anis, Mohamed I. Elmasry:
A Bias-Dependent Model for the Impact of Process Variations on the SRAM Soft Error Immunity. IEEE Trans. Very Large Scale Integr. Syst. 19(11): 2130-2134 (2011) - [c43]Mohamed Rabie, Ahmed Bahgat, Khaled Ramadan, Hosam Shobak, Tarek Nasr, Mohamed Abdelhafez, Eslam A. Moustafa, Mohab Anis:
A comparative analysis between FinFET Semi-Dynamic Flip-Flop topologies under process variations. ICEAC 2011: 1-6 - 2010
- [j27]Mohammed El-Abd
, Hassan Hassan, Mohab Anis, Mohamed S. Kamel, Mohamed I. Elmasry:
Discrete cooperative particle swarm optimization for FPGA placement. Appl. Soft Comput. 10(1): 284-295 (2010) - [j26]Akhilesh Kumar, Mohab Anis:
Power-Yield Enhancement for Field Programmable Gate Arrays Under Process Variations. J. Low Power Electron. 6(2): 280-290 (2010) - [j25]Akhilesh Kumar, Mohab Anis:
IR-Drop Management in FPGAs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(6): 988-993 (2010) - [j24]Javid Jaffari, Mohab Anis:
Advanced Variance Reduction and Sampling Techniques for Efficient Statistical Timing Analysis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(12): 1894-1907 (2010) - [j23]Vasudha Gupta, Mohab Anis:
Statistical Design of the 6T SRAM Bit Cell. IEEE Trans. Circuits Syst. I Regul. Pap. 57-I(1): 93-104 (2010) - [j22]Ahmed Youssef, Zhen Yang, Mohab Anis, Shawki Areibi, Anthony Vannelli, Mohamed I. Elmasry:
A Power-Efficient Multipin ILP-Based Routing Technique. IEEE Trans. Circuits Syst. I Regul. Pap. 57-I(1): 225-235 (2010) - [j21]Hassan Mostafa
, Mohab Anis, Mohamed I. Elmasry:
A Design-Oriented Soft Error Rate Variation Model Accounting for Both Die-to-Die and Within-Die Variations in Submicrometer CMOS SRAM Cells. IEEE Trans. Circuits Syst. I Regul. Pap. 57-I(6): 1298-1311 (2010) - [j20]Mohamed H. Abu-Rahma, Mohab Anis, Sei Seung Yoon:
Reducing SRAM Power Using Fine-Grained Wordline Pulsewidth Control. IEEE Trans. Very Large Scale Integr. Syst. 18(3): 356-364 (2010) - [j19]Akhilesh Kumar, Mohab Anis:
FPGA Design for Timing Yield Under Process Variations. IEEE Trans. Very Large Scale Integr. Syst. 18(3): 423-435 (2010) - [j18]Ahmed Youssef, Mohamed Zahran
, Mohab Anis, Mohamed I. Elmasry:
On the Power Management of Simultaneous Multithreading Processors. IEEE Trans. Very Large Scale Integr. Syst. 18(8): 1243-1248 (2010) - [c42]Javid Jaffari, Mohab Anis:
Practical Monte-Carlo based timing yield estimation of digital circuits. DATE 2010: 807-812 - [c41]Javid Jaffari, Mohab Anis:
Correlation controlled sampling for efficient variability analysis of analog circuits. DATE 2010: 1305-1308 - [c40]Akhilesh Kumar, Mohab Anis:
Robust FPGA Design under Variations. FPL 2010: 259-262 - [c39]Hassan Mostafa
, Mohab Anis, Mohamed I. Elmasry:
Comparative analysis of power yield improvement under process variation of sub-threshold flip-flops. ISCAS 2010: 1739-1742 - [c38]Hassan Mostafa
, Mohab Anis, Mohamed I. Elmasry:
Statistical timing yield improvement of dynamic circuits using negative capacitance technique. ISCAS 2010: 1747-1750 - [c37]Kian Haghdad, Mohab Anis:
Scaling analysis of yield optimization considering supply and threshold voltage variations. ISCAS 2010: 3665-3668
2000 – 2009
- 2009
- [j17]Mohab Anis, Emad Hegazi
:
Introduction to the special issue on the 2007 International Conference on Microelectronics. Microelectron. J. 40(11): 1503 (2009) - [j16]Hassan Hassan, Mohab Anis, Mohamed I. Elmasry:
Total Power Modeling in FPGAs Under Spatial Correlation. IEEE Trans. Very Large Scale Integr. Syst. 17(4): 578-582 (2009) - [c36]Javid Jaffari, Mohab Anis:
Adaptive sampling for efficient failure probability analysis of SRAM cells. ICCAD 2009: 623-630 - [c35]Javid Jaffari, Mohab Anis:
Timing yield estimation of digital circuits using a control variate technique. ISQED 2009: 382-387 - [c34]Akhilesh Kumar, Mohab Anis:
IR-drop management CAD techniques in FPGAs for power grid reliability. ISQED 2009: 746-752 - [c33]Hassan Mostafa
, Mohab Anis, Mohamed I. Elmasry:
Comparative Analysis of Timing Yield Improvement under Process Variations of Flip-Flops Circuits. ISVLSI 2009: 133-138 - 2008
- [j15]Javid Jaffari, Mohab Anis:
Thermal Driven Placement for Island-style MTCMOS FPGAs. J. Comput. 3(4): 24-30 (2008) - [j14]Javid Jaffari, Mohab Anis:
Variability-Aware Bulk-MOS Device Design. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(2): 205-216 (2008) - [j13]Javid Jaffari, Mohab Anis:
Statistical Thermal Profile Considering Process Variations: Analysis and Applications. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(6): 1027-1040 (2008) - [j12]Hassan Hassan, Mohab Anis, Mohamed I. Elmasry:
Input Vector Reordering for Leakage Power Reduction in FPGAs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(9): 1555-1564 (2008) - [j11]Kian Haghdad, Mohab Anis:
Design-Specific Optimization Considering Supply and Threshold Voltage Variations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(10): 1891-1901 (2008) - [j10]Mohamed H. Abu-Rahma, Mohab Anis:
A Statistical Design-Oriented Delay Variation Model Accounting for Within-Die Variations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(11): 1983-1995 (2008) - [j9]Ahmed Youssef, Mohab Anis, Mohamed I. Elmasry:
A Comparative Study Between Static and Dynamic Sleep Signal Generation Techniques for Leakage Tolerant Designs. IEEE Trans. Very Large Scale Integr. Syst. 16(9): 1114-1126 (2008) - [c32]Mohamed H. Abu-Rahma, Kinshuk Chowdhury, Joseph Wang, Zhiqin Chen, Sei Seung Yoon, Mohab Anis:
A methodology for statistical estimation of read access yield in SRAMs. DAC 2008: 205-210 - [c31]Vasudha Gupta, Mohab Anis:
Area/yield trade-offs in scaled CMOS SRAM cell. ESSCIRC 2008: 54-57 - [c30]Mohamed H. Abu-Rahma, Mohab Anis, Sei Seung Yoon:
A robust single supply voltage SRAM read assist technique using selective precharge. ESSCIRC 2008: 234-237 - [c29]Javid Jaffari, Mohab Anis:
On efficient Monte Carlo-based statistical static timing analysis of digital circuits. ICCAD 2008: 196-203 - [c28]Mohab Anis:
Advanced IC technology - opportunities and challenges. ISCAS 2008: 776-779 - [c27]Rodrigo Jaramillo-Ramirez, Javid Jaffari, Mohab Anis:
Variability-aware design of subthreshold devices. ISCAS 2008: 1196-1199 - [c26]Rizwan Mudassir, Mohab Anis, Javid Jaffari:
Switching activity reduction in low power Booth multiplier. ISCAS 2008: 3306-3309 - 2007
- [j8]Akhilesh Kumar, Mohab Anis:
Dual-Threshold CAD Framework for Subthreshold Leakage Power Aware FPGAs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(1): 53-66 (2007) - [c25]Hassan Hassan, Mohab Anis, Mohamed I. Elmasry:
A Timing-Driven Algorithm for Leakage Reduction in MTCMOS FPGAs. ASP-DAC 2007: 678-683 - [c24]Mohamed H. Abu-Rahma, Mohab Anis:
Variability in VLSI Circuits: Sources and Design Considerations. ISCAS 2007: 3215-3218 - [c23]Rodrigo Jaramillo-Ramirez, Mohab Anis:
A Dual-Threshold FPGA Routing Design for Subthreshold Leakage Reduction. ISCAS 2007: 3724-3727 - [c22]Ahmed Youssef, Tor Myklebust, Mohab Anis, Mohamed I. Elmasry:
A Low-Power Multi-Pin Maze Routing Methodology. ISQED 2007: 153-158 - [c21]Javid Jaffari, Mohab Anis:
Thermal-Aware Placement for FPGAs Using Electrostatic Charge Model. ISQED 2007: 666-671 - 2006
- [j7]Hassan Hassan, Mohab Anis, Mohamed I. Elmasry:
Impact of technology scaling and process variations on RF CMOS devices. Microelectron. J. 37(4): 275-282 (2006) - [j6]Hassan Hassan, Mohab Anis, Mohamed I. Elmasry:
Low-power multi-threshold MCML: Analysis, design, and variability. Microelectron. J. 37(10): 1097-1104 (2006) - [c20]Akhilesh Kumar, Mohab Anis:
An analytical state dependent leakage power model for FPGAs. DATE 2006: 612-617 - [c19]Javid Jaffari, Mohab Anis:
Variability-aware device optimization under ION and leakage current constraints. ISLPED 2006: 119-122 - [c18]Akhilesh Kumar, Mohab Anis:
Dual-Vt Design of FPGAs for Subthreshold Leakage Tolerance. ISQED 2006: 735-740 - [c17]Ahmed Youssef, Mohab Anis, Mohamed I. Elmasry:
Dynamic Standby Prediction for Leakage Tolerant Microprocessor Functional Units. MICRO 2006: 371-384 - 2005
- [j5]Hassan Hassan, Mohab Anis, Mohamed I. Elmasry:
Design and optimization of MOS current mode logic for parameter variations. Integr. 38(3): 417-437 (2005) - [j4]Ahmed Youssef, Mohab Anis, Mohamed I. Elmasry:
POMR: a power-aware interconnect optimization methodology. IEEE Trans. Very Large Scale Integr. Syst. 13(3): 297-307 (2005) - [j3]Hassan Hassan, Mohab Anis, Mohamed I. Elmasry:
MOS current mode circuits: analysis, design, and variability. IEEE Trans. Very Large Scale Integr. Syst. 13(8): 885-898 (2005) - [c16]Hratch Mangassarian, Mohab Anis:
On Statistical Timing Analysis with Inter- and Intra-Die Variations. DATE 2005: 132-137 - [c15]Hassan Hassan, Mohab Anis, Antoine El Daher, Mohamed I. Elmasry:
Activity Packing in FPGAs for Leakage Power Reduction. DATE 2005: 212-217 - [c14]Hassan Hassan, Mohab Anis, Mohamed I. Elmasry:
A leakage-aware CAD flow for MTCMOS FPGA architectures (abstract only). FPGA 2005: 267 - [c13]Akhilesh Kumar, Mohab Anis:
Dual-Vt FPGA design for leakage power reduction (abstract only). FPGA 2005: 272 - [c12]Hassan Hassan, Mohab Anis, Mohamed I. Elmasry:
LAP: a logic activity packing methodology for leakage power-tolerant FPGAs. ISLPED 2005: 257-262 - [c11]Mohab Anis, Mohamed H. Abu-Rahma:
Leakage Current Variability in Nanometer Technologies, invited. IWSOC 2005: 60-63 - [c10]Payam Ghafari, Ehsan Mirhadi, Mohab Anis, Shawki Areibi, Mohamed I. Elmasry:
A Low-Power Partitioning Methodology by Maximizing Sleep Time and Minimizing Cut Nets. IWSOC 2005: 368-371 - 2004
- [c9]Hassan Hassan, Mohab Anis, Mohamed I. Elmasry:
Design and optimization of MOS current mode logic for parameter variations. ACM Great Lakes Symposium on VLSI 2004: 33-38 - [c8]Wenxin Wang, Mohab Anis, Shawki Areibi:
Fast techniques for standby leakage reduction in MTCMOS circuits. SoCC 2004: 21-24 - [c7]Hassan Hassan, Mohab Anis, Mohamed I. Elmasry:
Analysis and design of low-power multi-threshold MCML. SoCC 2004: 25-29 - [c6]Ahmed Youssef, Mohab Anis, Mohamed I. Elmasry:
POMR: a power-optimal maze routing methodology. SoCC 2004: 73-77 - [c5]Hassan Hassan, Mohab Anis, Mohamed I. Elmasry:
Impact of technology scaling on RF CMOS. SoCC 2004: 97-101 - [c4]Hassan Hassan, Mohab Anis, Mohamed I. Elmasry:
MOS current mode logic: design, optimization, and variability. SoCC 2004: 247-250 - 2003
- [j2]Mohab Anis, Shawki Areibi, Mohamed I. Elmasry:
Design and optimization of multithreshold CMOS (MTCMOS) circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 22(10): 1324-1342 (2003) - 2002
- [j1]Mohab Anis, Mohamed W. Allam, Mohamed I. Elmasry:
Energy-efficient noise-tolerant dynamic styles for scaled-down CMOS and MTCMOS technologies. IEEE Trans. Very Large Scale Integr. Syst. 10(2): 71-78 (2002) - [c3]Mohab Anis, Mohamed Mahmoud, Mohamed I. Elmasry, Shawki Areibi:
Dynamic and leakage power reduction in MTCMOS circuits using an automated efficient gate clustering technique. DAC 2002: 480-485 - [c2]Mohab Anis, Mohamed I. Elmasry:
Self-timed MOS current mode logic for digital applications. ISCAS (5) 2002: 113-116 - 2000
- [c1]Mohamed W. Allam, Mohab Anis, Mohamed I. Elmasry:
High-speed dynamic logic styles for scaled-down CMOS and MTCMOS technologies. ISLPED 2000: 155-160
Coauthor Index
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