"A Bias-Dependent Model for the Impact of Process Variations on the SRAM ..."

Hassan Mostafa, Mohab Anis, Mohamed I. Elmasry (2011)

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DOI: 10.1109/TVLSI.2010.2068317

access: closed

type: Journal Article

metadata version: 2020-03-11

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Hassan Mostafa, Mohab Anis, Mohamed I. Elmasry:
A Bias-Dependent Model for the Impact of Process Variations on the SRAM Soft Error Immunity. IEEE Trans. Very Large Scale Integr. Syst. 19(11): 2130-2134 (2011)

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