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Young-Kwan Park
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2000 – 2009
- 2008
- [c6]Young-Gu Kim, Soo-Hwan Kim, Hoon Lim, Sanghoon Lee, Keun-Ho Lee, Young-Kwan Park, Moon-Hyun Yoo:
The Statistical Failure Analysis for the Design of Robust SRAM in Nano-Scale Era. ISQED 2008: 369-372 - 2006
- [c5]Young-Gu Kim, Sang-Hoon Lee, Dae-Han Kim, Jae-Woo Im, Sung-Eun Yu, Dae-Wook Kim, Young-Kwan Park, Jeong-Taek Kong:
Sensing Margin Analysis of MLC Flash Memories Using a Novel Unified Statistical Model. ISQED 2006: 185-189 - 2003
- [c4]Won-Seok Lee, Keun-Ho Lee, Jin-Kyu Park, Tae-Kyung Kim, Young-Kwan Park, Jeong-Taek Kong:
Investigation of the capacitance deviation due to metal-fills and the effective interconnect geometry modeling. ISQED 2003: 373-376 - 2002
- [c3]Jin-Kyu Park, Keun-Ho Lee, Chang-Sub Lee, Gi-Young Yang, Young-Kwan Park, Jeong-Taek Kong:
Characterizing the Current Degradation of Abnormally Structured MOS Transistors Using a 3D Poisson Solver. ISQED 2002: 322-325 - 2001
- [c2]Tae-Jin Kwon, Sang-Hoon Lee, Tae-Seon Kim, Hoe-Jin Lee, Young-Kwan Park, Taek-Soo Kim, Seok-Jin Kim, Jeong-Taek Kong:
Performance Improvement for High Speed Devices Using E-tests and the SPICE Model. ISQED 2001: 443-447 - 2000
- [c1]Kwan-Do Kim, Young-Kwan Park, Jun-Ha Lee, Jeong-Taek Kong, Hee-Sung Kang, Young-Wug Kim, Seok-Jin Kim:
Three Dimensional Analysis of Thermal Degradation Effects in FDSOI MOSFET's. ISQED 2000: 87-
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