"Three Dimensional Analysis of Thermal Degradation Effects in FDSOI MOSFET's."

Kwan-Do Kim et al. (2000)

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DOI: 10.1109/ISQED.2000.838859

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Kwan-Do Kim, Young-Kwan Park, Jun-Ha Lee, Jeong-Taek Kong, Hee-Sung Kang, Young-Wug Kim, Seok-Jin Kim:
Three Dimensional Analysis of Thermal Degradation Effects in FDSOI MOSFET's. ISQED 2000: 87-

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