"Characterizing the Current Degradation of Abnormally Structured MOS ..."

Jin-Kyu Park et al. (2002)

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DOI: 10.1109/ISQED.2002.996765

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Jin-Kyu Park, Keun-Ho Lee, Chang-Sub Lee, Gi-Young Yang, Young-Kwan Park, Jeong-Taek Kong:
Characterizing the Current Degradation of Abnormally Structured MOS Transistors Using a 3D Poisson Solver. ISQED 2002: 322-325

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