"The Statistical Failure Analysis for the Design of Robust SRAM in ..."

Young-Gu Kim et al. (2008)

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DOI: 10.1109/ISQED.2008.4479759

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/isqed/KimKLLLPY08
Young-Gu Kim, Soo-Hwan Kim, Hoon Lim, Sanghoon Lee, Keun-Ho Lee, Young-Kwan Park, Moon-Hyun Yoo:
The Statistical Failure Analysis for the Design of Robust SRAM in Nano-Scale Era. ISQED 2008: 369-372

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