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Books and Theses
- 1996
[b1]Jean-Michel Karam:
Méthodes et outils pour la conception et la fabrication des microsystèmes. (Methods and tools for the design and manufacturing of microsystems). Grenoble Institute of Technology, France, 1996
Journal Articles
- 2000
- [j3]Raúl Andrés Bianchi, Jean-Michel Karam, Bernard Courtois:
Analog ALC crystal oscillators for high-temperature applications. IEEE J. Solid State Circuits 35(1): 2-14 (2000) - 1998
- [j2]Vladimír Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois:
Thermal Monitoring of Self-Checking Systems. J. Electron. Test. 12(1-2): 81-92 (1998) - 1997
- [j1]Jean-Michel Karam, Bernard Courtois, Hicham Boutamine:
CAD Tools for Bridging Microsystems and Foundries. IEEE Des. Test Comput. 14(2): 34-39 (1997)
Conference and Workshop Papers
- 1999
- [c9]K. Liateni, D. Moulinier, B. Affour, A. Delpoux, Jean-Michel Karam:
Moving MEMS into Mainstream Applications: The MEMSCAP Solution. VLSI 1999: 544-556 - [c8]Bernard Courtois, Jean-Michel Karam, Salvador Mir, Marcelo Lubaszewski, Vladimír Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner:
Design and Test of MEMs. VLSI Design 1999: 270- - 1998
- [c7]A. Castillejo, D. Veychard, Salvador Mir, Jean-Michel Karam, Bernard Courtois:
Failure mechanisms and fault classes for CMOS-compatible microelectromechanical systems. ITC 1998: 541-550 - [c6]Jean-Michel Karam, Marcelo Lubaszewski, R. D. Shawn Blanton, Andrew Richardson:
Testing MEMS. VTS 1998: 320-321 - 1997
- [c5]Jean-Michel Karam, Bernard Courtois, Hicham Boutamine, P. Drake, András Poppe, Vladimír Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner:
CAD and Foundries for Microsystems. DAC 1997: 674-679 - [c4]Klaus Hofmann, Manfred Glesner, Nicu Sebe, Anca Manuela Manolescu, Santiago Marco, Josep Samitier, Jean-Michel Karam, Bernard Courtois:
Generation of the HDL-A-model of a micromembrane from its finite-element-description. ED&TC 1997: 108-112 - 1996
- [c3]Vladimír Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois:
Thermal Monitoring Of Safety-Critical Integrated Systems. Asian Test Symposium 1996: 282-288 - [c2]Jean-Michel Karam, Bernard Courtois, M. Bauge:
High level CAD melds microsystems with foundries. ED&TC 1996: 442-447 - [c1]Jean-Michel Karam, Bernard Courtois, András Poppe
, Klaus Hofmann, Márta Rencz, Manfred Glesner, Vladimír Székely:
Applied design and analysis of microsystems. ED&TC 1996: 528-532
Coauthor Index
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