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ORCIDPetru V. Notingher
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- affiliation: University of Poitiers, PPRIME Institute, France
- affiliation: University of Montpellier, Institute of Electronics and Systems, France
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2020 – today
- 2021
[j1]Ilona Plesa
, Petru V. Notingher, Sandra Schlögl, Cristina Stancu, Andrea Johanna Wanner, Karin Wewerka, Philipp Marx, Frank Wiesbrock:
Structural Model for the Estimation of the Equivalent Permittivity of Nanodielectrics Based on Polyethylene and Epoxy Resins. IEEE Access 9: 123927-123938 (2021)- 2020
- [c9]Norimitsu Ichikawa, Hiroki Kimura, Petru V. Notingher, Nicholas G. Paulter:
Electrostatically Induced Voltage in Metal Box When Charged Object Like Hand Moves Away from the Box to Three Directions. IAS 2020: 1-6
2010 – 2019
- 2014
- [c8]Sylvain Baudon, Petru V. Notingher, Serge Agnel, Stéphane Holé:
Advances in electric charge measurements in semi-conducting structures by non-destructive thermal methods. IAS 2014: 1-7 - [c7]Jean-Charles Laurentie, Hanen Yahyaoui, Petru V. Notingher, Jerome Castellon, Serge Agnel:
Contactless electric field and space charge measurement across solid dielectrics: A fully non-intrusive thermal technique. IAS 2014: 1-4 - 2012
- [c6]Abdallah Darkawi, Thierry Martiré, Jean-Jacques Huselstein, François Forest, Petru V. Notingher:
Modeling and design of multi-cell buck converters using InterCell Transformers for HVDC cable diagnostic. IECON 2012: 561-566 - 2011
- [c5]Marius-Cristian Plopeanu, Lucian Dascalescu, Belkacem Yahiaoui, Angela Antoniu, Mircea Hulea, Petru V. Notingher:
Distribution of electric potential at the surface of corona-charged non-woven fabrics. IAS 2011: 1-5 - 2010
- [c4]Ludovic Boyer, Petru Notingher Jr., Serge Agnel, Bernard Rousset, Jean-Louis Sanchez:
Measurement of Charge Evolution in Oxides of DC Stressed MOS Structures. IAS 2010: 1-8
2000 – 2009
- 2008
- [c3]Ludovic Boyer, Olivier Fruchier, Petru Notingher Jr., Serge Agnel, Alain Toureille, Bernard Rousset, Jean-Louis Sanchez:
Analysis of Data Obtained Using the Thermal Step Method on a MOS Structure - An Electrostatic Approach. IAS 2008: 1-6 - 2007
- [c2]Olivier Fruchier, Petru Notingher Jr., Serge Agnel, Alain Toureille, F. Forest, S. Cunningham, Bernard Rousset, Jean-Louis Sanchez:
Applications of the Thermal Step Method to the Characterization of Electric Charge in MOS Components. IAS 2007: 444-451 - [c1]Octavian Blejan, Petru V. Notingher, Laurentiu Marius Dumitran, Mohamed Younes, Adrian Samuila, Lucian Dascalescu:
Experimental Study of the Corona Discharge in a Modified Coaxial Wire-Cylinder Electrostatic Precipitator. IAS 2007: 1111-1114
Coauthor Index
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