"Applications of the Thermal Step Method to the Characterization of ..."

Olivier Fruchier et al. (2007)

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DOI: 10.1109/07IAS.2007.72

access: closed

type: Conference or Workshop Paper

metadata version: 2023-10-20

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Olivier Fruchier, Petru Notingher Jr., Serge Agnel, Alain Toureille, F. Forest, S. Cunningham, Bernard Rousset, Jean-Louis Sanchez:
Applications of the Thermal Step Method to the Characterization of Electric Charge in MOS Components. IAS 2007: 444-451

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