"Analysis of Data Obtained Using the Thermal Step Method on a MOS Structure ..."

Ludovic Boyer et al. (2008)

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DOI: 10.1109/08IAS.2008.111

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-06

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Ludovic Boyer, Olivier Fruchier, Petru Notingher Jr., Serge Agnel, Alain Toureille, Bernard Rousset, Jean-Louis Sanchez:
Analysis of Data Obtained Using the Thermal Step Method on a MOS Structure - An Electrostatic Approach. IAS 2008: 1-6

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