"Measurement of Charge Evolution in Oxides of DC Stressed MOS Structures."

Ludovic Boyer et al. (2010)

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DOI: 10.1109/IAS.2010.5614500

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-06

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Ludovic Boyer, Petru Notingher Jr., Serge Agnel, Bernard Rousset, Jean-Louis Sanchez:
Measurement of Charge Evolution in Oxides of DC Stressed MOS Structures. IAS 2010: 1-8

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