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2020 – today
- 2020
[c5]Brian P. Downey, Andy Xie, Shawn Mack, D. Scott Katzer
, James G. Champlain, Yu Cao, Neeraj Nepal, Tyler A. Growden, Vikrant J. Gokhale, Robert L. Coffie, Matthew T. Hardy, Edward Beam, Cathy Lee, David J. Meyer:
Micro-transfer Printing of GaN HEMTs for Heterogeneous Integration and Flexible RF Circuit Design. DRC 2020: 1-2
2010 – 2019
- 2019
- [c4]Yongjie Cui, Yu Cao, Manyam Pilla, Edward Beam, Andy Xie, Cathy Lee, Andrew Ketterson, Michael Roach, Anton Geiler, Michael Geiler, Lee Burns, Douglas Linkhart:
Integration of Self-Biased Circulators on GaN/SiC for Ka-band RF application. DRC 2019: 41-42 - 2015
- [c3]A. Sasikumar, Z. Zhang, P. Kumar, En-xia Zhang, Daniel M. Fleetwood, Ronald D. Schrimpf, Paul Saunier, Cathy Lee, S. A. Ringel, Aaron R. Arehart:
Proton irradiation-induced traps causing VT instabilities and RF degradation in GaN HEMTs. IRPS 2015: 2 - 2010
- [j4]Michael H. Perrott, Sudhakar Pamarti, Eric G. Hoffman, Fred S. Lee, Shouvik Mukherjee, Cathy Lee, Vadim Tsinker, Sathi Perumal, Benjamin Soto, Niveditha Arumugam, Bruno W. Garlepp:
A Low Area, Switched-Resistor Based Fractional-N Synthesizer Applied to a MEMS-Based Programmable Oscillator. IEEE J. Solid State Circuits 45(12): 2566-2581 (2010) - [c2]Michael H. Perrott, Sudhakar Pamarti, Eric G. Hoffman, Fred S. Lee, Shouvik Mukherjee, Cathy Lee, Vadim Tsinker, Sathi Perumal, Benjamin Soto, Niveditha Arumugam, Bruno W. Garlepp:
A low-area switched-resistor loop-filter technique for fractional-N synthesizers applied to a MEMS-based programmable oscillator. ISSCC 2010: 244-245
2000 – 2009
- 2009
- [j3]Charles Campbell, Cathy Lee, Victoria Williams, Ming-Yih Kao, Hua-Quen Tserng, Paul Saunier, Tony Balistreri:
A Wideband Power Amplifier MMIC Utilizing GaN on SiC HEMT Technology. IEEE J. Solid State Circuits 44(10): 2640-2647 (2009) - [j2]S. Y. Park, Carlo Floresca, Uttiya Chowdhury, Jose L. Jimenez, Cathy Lee, Edward Beam, Paul Saunier, Tony Balistreri, Moon J. Kim:
Physical degradation of GaN HEMT devices under high drain bias reliability testing. Microelectron. Reliab. 49(5): 478-483 (2009) - 2006
- [c1]Cindy Dooling, Jeff White, Cathy Lee:
Software management. SIGUCCS 2006: 89-93
1990 – 1999
- 1998
- [j1]G. Diwakar Vishakhadatta, Russell Croman, Marius Goldenberg, Jerrell P. Hein, Pradeep Katikaneni, Diana Kuai, Cathy Lee, Ion Constatin Tesu, Richard Trujillo, Ligang Zhang, Kent Anderson, Richard Behrens, William Bliss, Li Du, Trent Dudley, German Feyh, William Foland, Michael Kastner, Qingfen Li, Jeff Mitchem, David Reed, Sian She, Mark Spurbeck, Lisa Sundell, Hoai Tran, Maoxin Wei, Christopher Zook:
An EPR4 read/write channel with digital timing recovery. IEEE J. Solid State Circuits 33(11): 1851-1857 (1998)
Coauthor Index
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