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ORCIDJohann Cervenka
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2020 – today
- 2023
[c7]Johann Cervenka
, Robert Kosik, Felipe Ribeiro:
Parallel Solution of the Schrödinger-Poisson Equation on GPUs. LSSC 2023: 375-382- [c6]Robert Kosik, Johann Cervenka, Dominic Waldhör, Felipe Ribeiro, Hans Kosina:
Exploring the Global Solution Space of a Simple Schrödinger-Poisson Problem. LSSC 2023: 472-480
2010 – 2019
- 2019
- [c5]Robert Kosik, Johann Cervenka, Mischa Thesberg, Hans Kosina:
A Revised Wigner Function Approach for Stationary Quantum Transport. LSSC 2019: 403-410 - 2015
- [c4]Johann Cervenka, Paul Ellinghaus, Mihail Nedjalkov, Erasmus Langer:
Optimization of the Deterministic Solution of the Discrete Wigner Equation. LSSC 2015: 269-276 - 2014
- [c3]Johann Cervenka, Paul Ellinghaus, Mihail Nedjalkov:
Deterministic Solution of the Discrete Wigner Equation. NMA 2014: 149-156 - 2011
- [c2]Lado Filipovic, Hajdin Ceric, Johann Cervenka, Siegfried Selberherr:
A simulator for local anodic oxidation of silicon surfaces. CCECE 2011: 695-698 - 2010
- [j3]Stanislav Tyaginov, Ivan A. Starkov, Oliver Triebl, Johann Cervenka, C. Jungemann, Sara Carniello, Jong Mun Park, Hubert Enichlmair, Markus Karner, Ch. Kernstock, Ehrenfried Seebacher, Rainer Minixhofer, Hajdin Ceric, Tibor Grasser:
Interface traps density-of-states as a vital component for hot-carrier degradation modeling. Microelectron. Reliab. 50(9-11): 1267-1272 (2010)
2000 – 2009
- 2009
- [c1]M. Vasicek, Viktor Sverdlov, Johann Cervenka, Tibor Grasser, Hans Kosina, Siegfried Selberherr:
Transport in Nanostructures: A Comparative Analysis Using Monte Carlo Simulation, the Spherical Harmonic Method, and Higher Moments Models. LSSC 2009: 443-450 - 2006
- [j2]Johann Cervenka, W. Wessner, E. Al-Ani, Tibor Grasser, Siegfried Selberherr:
Generation of Unstructured Meshes for Process and Device Simulation by Means of Partial Differential Equations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(10): 2118-2128 (2006) - [j1]W. Wessner, Johann Cervenka, Clemens Heitzinger, Andreas Hössinger, Siegfried Selberherr:
Anisotropic Mesh Refinement for the Simulation of Three-Dimensional Semiconductor Manufacturing Processes. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(10): 2129-2139 (2006)
Coauthor Index
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