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J. T. M. van Beek

Joost T. M. van Beek

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2000 – 2009

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2008
[j3]
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  - journals/mr/BendidaKBBWGN08
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  - https://dblp.org/rec/journals/mr/BendidaKBBWGN08
S. Bendida, J. J. Koning, J. J. M. Bontemps, J. T. M. van Beek, D. Wu, Marcel A. J. van Gils, S. Nath:
Temperature stability of a piezoresistive MEMS resonator including self-heating. Microelectron. Reliab. 48(8-9): 1227-1231 (2008)
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Q. Li, J. F. L. Goosen, J. T. M. van Beek, Fred van Keulen, K. L. Phan, G. Q. Zhang:
Failure analysis of a thin-film nitride MEMS package. Microelectron. Reliab. 48(8-9): 1557-1561 (2008)
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Jeroen J. M. Zaal, W. D. van Driel, S. Bendida, Q. Li, J. T. M. van Beek, G. Q. Zhang:
Packaging influences on the reliability of MEMS resonators. Microelectron. Reliab. 48(8-9): 1567-1571 (2008)
2003
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  - conf/esscirc/RijksBUCPDT03
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Theo G. S. M. Rijks, Joost T. M. van Beek, M. J. E. Ulenaers, Jeroen De Coster, Robert Puers, Arnold J. den Dekker, L. van Teeffelen:
Passive integration and RF MEMS: a toolkit for adaptive LC circuits. ESSCIRC 2003: 269-272

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