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J. F. L. Goosen

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2000 – 2009

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2008
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Q. Li, J. F. L. Goosen, J. T. M. van Beek, Fred van Keulen, K. L. Phan, G. Q. Zhang:
Failure analysis of a thin-film nitride MEMS package. Microelectron. Reliab. 48(8-9): 1557-1561 (2008)

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