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2020 – today
- 2024
[c11]Jyoti Patel, Navjeet Bagga, Vivek Kumar, S. Dasgupta:
Small Signal Analysis of Nanosheet Transistor for sub-THz Frequency Considering Intersheet Capacitances and Modified Admittance Parameters. DRC 2024: 1-2- [c10]Sunil Rathore, Navjeet Bagga, S. Dasgupta:
Self-Heating and Process-Induced Threshold Voltage Aware Reliability and Aging Analysis of Forksheet FET. IRPS 2024: 65 - [c9]Navneet Gandhi, Rajeewa Kumar Jaisawal, P. N. Kondekar, Ankit Dixit, Naveen Kumar, Vihar P. Georgiev, Navjeet Bagga:
Demonstration of a Vertically Stacked Junctionless Forksheet as Dielectric Modulated Biosensor. VDAT 2024: 1-4 - 2023
- [j3]Sunil Rathore, Rajeewa Kumar Jaisawal
, Pravin Neminath Kondekar, Navjeet Bagga:
Investigation of Analog/RF and linearity performance with self-heating effect in nanosheet FET. Microelectron. J. 139: 105904 (2023) - [c8]Navneet Gandhi, Rajeewa Kumar Jaisawal, Sunil Rathore, P. N. Kondekar, Ankit Dixit, Naveen Kumar, Vihar P. Georgiev, Navjeet Bagga:
Gate Oxide Induced Reliability Assessment of Junctionless FinFET-Based Hydrogen Gas Sensor. SENSORS 2023: 1-4 - [c7]Sunil Rathore, Rajeewa Kumar Jaisawal, P. N. Kondekar, Navneet Gandhi, Shashank Banchhor, Young Suh Song, Navjeet Bagga:
Self-Heating Aware Threshold Voltage Modulation Conforming to Process and Ambient Temperature Variation for Reliable Nanosheet FET. IRPS 2023: 1-5 - 2022
- [j2]Sunil Rathore, Rajeewa Kumar Jaisawal, Navneet Gandhi, P. N. Kondekar, Navjeet Bagga:
Substrate BOX engineering to mitigate the self-heating induced degradation in nanosheet transistor. Microelectron. J. 129: 105590 (2022) - [j1]Toushik Santra, Ankit Dixit, Rajeewa Kumar Jaisawal, Sunil Rathore, Saheli Sarkhel, Navjeet Bagga:
Investigation of geometrical impact on a P+ buried negative capacitance SOI FET. Microelectron. J. 130: 105617 (2022) - [c6]Navjeet Bagga, Kai Ni, Nitanshu Chauhan, Om Prakash, X. Sharon Hu, Hussam Amrouch:
Cleaved-Gate Ferroelectric FET for Reliable Multi-Level Cell Storage. IRPS 2022: 5-1 - [c5]Nitanshu Chauhan, Chirag Garg, Kai Ni, Amit Kumar Behera, Sarita Yadav, Shashank Banchhor, Navjeet Bagga, Avirup Dasgupta, Arnab Datta, Sudeb Dasgupta, Anand Bulusu:
Impact of Random Spatial Fluctuation in Non-Uniform Crystalline Phases on Multidomain MFIM Capacitor and Negative Capacitance FDSOI. IRPS 2022: 23-1 - [c4]Aniket Gupta, Govind Bajpai, Navjeet Bagga, Shashank Banchhor, Sudeb Dasgupta, Anand Bulusu, Nitanshu Chauhan:
Unveiling the Impact of Interface Traps Induced on Negative Capacitance Nanosheet FET: A Reliability Perspective. VDAT 2022: 85-96 - [c3]Rajeewa Kumar Jaisawal, Sunil Rathore, P. N. Kondekar, Navjeet Bagga:
Impact of Temperature on NDR Characteristics of a Negative Capacitance FinFET: Role of Landau Parameter (α). VDAT 2022: 97-106 - 2021
- [c2]Aniket Gupta, Govind Bajpai, Priyanshi Singhal, Navjeet Bagga, Om Prakash, Shashank Banchhor, Hussam Amrouch, Nitanshu Chauhan:
Traps Based Reliability Barrier on Performance and Revealing Early Ageing in Negative Capacitance FET. IRPS 2021: 1-6 - 2020
- [c1]Nitanshu Chauhan, Govind Bajpai, Shashank Banchhor, Navjeet Bagga:
Analysis of Transient Negative Capacitance Characteristics for Stabilization and Amplification. VDAT 2020: 1-5
Coauthor Index
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