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"Traps Based Reliability Barrier on Performance and Revealing Early Ageing ..."
Aniket Gupta et al. (2021)
- Aniket Gupta, Govind Bajpai, Priyanshi Singhal, Navjeet Bagga, Om Prakash, Shashank Banchhor, Hussam Amrouch, Nitanshu Chauhan:
Traps Based Reliability Barrier on Performance and Revealing Early Ageing in Negative Capacitance FET. IRPS 2021: 1-6
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