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"Gate Oxide Induced Reliability Assessment of Junctionless FinFET-Based ..."
Navneet Gandhi et al. (2023)
- Navneet Gandhi, Rajeewa Kumar Jaisawal
, Sunil Rathore, P. N. Kondekar, Ankit Dixit, Navneen Kumar, Vihar Georgiev, Navjeet Bagga:
Gate Oxide Induced Reliability Assessment of Junctionless FinFET-Based Hydrogen Gas Sensor. SENSORS 2023: 1-4
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