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2020 – today
- 2023
[j6]Chia-Heng Yen
, Chun-Teng Chen, Cheng-Yen Wen, Ying-Yen Chen, Jih-Nung Lee, Shu-Yi Kao, Kai-Chiang Wu, Mango Chia-Tso Chao:
CNN-Based Stochastic Regression for IDDQ Outlier Identification. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(11): 4282-4295 (2023)- 2022
- [j5]Yu-Teng Nien, Kai-Chiang Wu, Dong-Zhen Lee, Ying-Yen Chen, Po-Lin Chen, Mason Chern, Jih-Nung Lee, Shu-Yi Kao, Mango Chia-Tso Chao:
Methodology of Generating Timing-Slack-Based Cell-Aware Tests. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(11): 5057-5070 (2022) - [c18]Dong-Zhen Lee, Ying-Yen Chen, Kai-Chiang Wu, Mango C.-T. Chao:
Improving Cell-Aware Test for Intra-Cell Short Defects. DATE 2022: 436-441 - 2021
- [c17]Cheng-Hao Yang, Chia-Heng Yen, Ting-Rui Wang, Chun-Teng Chen, Mason Chern, Ying-Yen Chen, Jih-Nung Lee, Shu-Yi Kao, Kai-Chiang Wu, Mango Chia-Tso Chao:
Identifying Good-Dice-in-Bad-Neighborhoods Using Artificial Neural Networks. VTS 2021: 1-7 - 2020
- [c16]Chun-Teng Chen, Chia-Heng Yen, Cheng-Yen Wen, Cheng-Hao Yang, Kai-Chiang Wu, Mason Chern, Ying-Yen Chen, Chun-Yi Kuo, Jih-Nung Lee, Shu-Yi Kao, Mango Chia-Tso Chao:
CNN-based Stochastic Regression for IDDQ Outlier Identification. VTS 2020: 1-6
2010 – 2019
- 2019
- [c15]Yu-Teng Nien, Kai-Chiang Wu, Dong-Zhen Lee, Ying-Yen Chen, Po-Lin Chen, Mason Chern, Jih-Nung Lee, Shu-Yi Kao, Mango Chia-Tso Chao:
Methodology of Generating Timing-Slack-Based Cell-Aware Tests. ITC 2019: 1-10 - [c14]Tse-Wei Wu, Dong-Zhen Lee, Yu-Hao Huang, Mango C.-T. Chao, Kai-Chiang Wu, Shu-Yi Kao, Ying-Yen Chen, Po-Lin Chen, Mason Chern, Jih-Nung Lee:
Layout-Based Dual-Cell-Aware Tests. VTS 2019: 1-6 - 2018
- [j4]Chien-Hsueh Lin, Chih-Ying Tsai, Kao-Chi Lee, Sung-Chu Yu, Wen-Rong Liau, Alex Chun-Liang Hou, Ying-Yen Chen, Chun-Yi Kuo, Jih-Nung Lee, Mango C.-T. Chao:
A Model-Based-Random-Forest Framework for Predicting Vt Mean and Variance Based on Parallel Id Measurement. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(10): 2139-2151 (2018) - 2017
- [c13]Tzu-Hsuan Huang, Wei-Tse Hung, Hao-Yu Yang, Wen-Hsiang Chang, Ying-Yen Chen, Chun-Yi Kuo, Jih-Nung Lee, Mango C.-T. Chao:
Predicting Vt variation and static IR drop of ring oscillators using model-fitting techniques. ASP-DAC 2017: 426-431 - [c12]Yu-Hao Huang, Ching-Ho Lu, Tse-Wei Wu, Yu-Teng Nien, Ying-Yen Chen, Max Wu, Jih-Nung Lee, Mango C.-T. Chao:
Methodology of generating dual-cell-aware tests. VTS 2017: 1-6 - 2016
- [c11]Chih-Ying Tsai, Kao-Chi Lee, Chien-Hsueh Lin, Sung-Chu Yu, Wen-Rong Liau, Alex Chun-Liang Hou, Ying-Yen Chen, Chun-Yi Kuo, Jih-Nung Lee, Mango C.-T. Chao:
Predicting Vt mean and variance from parallel Id measurement with model-fitting technique. VTS 2016: 1-6 - 2014
- [c10]Shih-Min Chao, Po-Juei Chen, Jing-Yu Chen, Po-Hao Chen, Ang-Feng Lin, James Chien-Mo Li, Pei-Ying Hsueh, Chun-Yi Kuo, Ying-Yen Chen, Jih-Nung Li:
Divide and conquer diagnosis for multiple defects. ITC 2014: 1-8 - 2013
- [c9]Ying-Yen Chen:
Fuzzy Flexible Delivery and Pickup Problem with Time Windows. ITQM 2013: 379-386 - 2012
- [j3]Hsiao-Fan Wang, Ying-Yen Chen:
A genetic algorithm for the simultaneous delivery and pickup problems with time window. Comput. Ind. Eng. 62(1): 84-95 (2012) - 2011
- [c8]Jing-Jia Liou, Ying-Yen Chen, Chun-Chia Chen, Chung-Yen Chien, Kuo-Li Wu:
Diagnosis-assisted supply voltage configuration to increase performance yield of cell-based designs. ASP-DAC 2011: 279-284 - 2010
- [j2]Chun-Yu Yang, Ying-Yen Chen, Sung-Yu Chen, Jing-Jia Liou:
Automatic Test Wrapper Synthesis for a Wireless ATE Platform. IEEE Des. Test Comput. 27(3): 31-41 (2010)
2000 – 2009
- 2009
- [c7]Sung-Yu Chen, Ying-Yen Chen, Chun-Yu Yang, Jing-Jia Liou:
Multiple-Core under Test Architecture for HOY Wireless Testing Platform. Asian Test Symposium 2009: 275-280 - [c6]Ying-Yen Chen, Jing-Jia Liou:
A Non-Intrusive and Accurate Inspection Method for Segment Delay Variabilities. Asian Test Symposium 2009: 343-348 - 2008
- [j1]Ying-Yen Chen, Jing-Jia Liou:
Diagnosis Framework for Locating Failed Segments of Path Delay Faults. IEEE Trans. Very Large Scale Integr. Syst. 16(6): 755-765 (2008) - 2007
- [c5]Ying-Yen Chen, Jing-Jia Liou:
Extraction of Statistical Timing Profiles Using Test Data. DAC 2007: 509-514 - [c4]Jing-Jia Liou, Chih-Tsun Huang, Cheng-Wen Wu, Ching-Cheng Tien, Chi-Hu Wang, Hsi-Pin Ma, Ying-Yen Chen, Yueh-Chih Hsu, Li-Ming Denq, Chien-Jung Chiu, Young-Wey Li, Chieh-Ming Chang:
A prototype of a wireless-based test system. SoCC 2007: 225-228 - [c3]Jyun-Wei Chen, Ying-Yen Chen, Jing-Jia Liou:
Handling Pattern-Dependent Delay Faults in Diagnosis. VTS 2007: 151-157 - 2006
- [c2]Ying-Yen Chen, Jing-Jia Liou:
Enhancing Diagnosis Resolution For Delay Faults By Path Extension Method. DFT 2006: 428-438 - 2005
- [c1]Ying-Yen Chen, Min-Pin Kuo, Jing-Jia Liou:
Diagnosis framework for locating failed segments of path delay faults. ITC 2005: 8
Coauthor Index
aka: Mango C.-T. Chao
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