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ORCIDPablo Saraza-Canflanca
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2020 – today
- 2024
[c19]Y. Guo, Robin Degraeve, Michiel Vandemaele, Pablo Saraza-Canflanca, Jacopo Franco, Ben Kaczer, Erik Bury, Ingrid Verbauwhede
:
Exploiting Bias Temperature Instability for Reservoir Computing in Edge Artificial Intelligence Applications. IRPS 2024: 1-7- [c18]Javier Diaz-Fortuny, Pablo Saraza-Canflanca, Alex Romano-Molar, Erik Bury, Robin Degraeve, Ben Kaczer:
Demonstration of Chip Overclock Detection by Employing Tamper-Aware Odometer Technology. IRPS 2024: 4 - [c17]Pablo Saraza-Canflanca, Dishant Sangani, Javier Diaz-Fortuny, Stanislav Tyaginov, Georges G. E. Gielen, Erik Bury, Ben Kaczer:
Statistical Characterization of Off-State Stress Degradation in Planar HKMG nFETs Using Device Arrays. IRPS 2024: 8 - 2023
- [c16]Javier Diaz-Fortuny, Dishant Sangani, Pablo Saraza-Canflanca, Erik Bury, Robin Degraeve, Ben Kaczer:
Improving the Tamper-Aware Odometer Concept by Enhancing Dynamic Stress Operation. IRPS 2023: 1-9 - [c15]Javier Martín-Martínez, Javier Diaz-Fortuny, Pablo Saraza-Canflanca, Rosana Rodríguez, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández, Montserrat Nafría:
Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability. IRPS 2023: 1-9 - [c14]Pablo Saraza-Canflanca, Javier Diaz-Fortuny, Andrea Vici, Erik Bury, Robin Degraeve, Ben Kaczer:
Using dedicated device arrays for the characterization of TDDB in a scaled HK/MG technology. IRPS 2023: 1-6 - [c13]Francisco V. Fernández, Elisenda Roca, Pablo Saraza-Canflanca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Rafael Castro-López:
Strategies for parameter extraction of the time constant distribution of time-dependent variability models for nanometer-scale devices. SMACD 2023: 1-4 - [c12]Andrés Santana-Andreo, Pablo Saraza-Canflanca, Héctor Carrasco-Lopez, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández:
A detailed, cell-by-cell look into the effects of aging on an SRAM PUF using a specialized test array. SMACD 2023: 1-4 - 2022
- [j4]Andrés Santana-Andreo, Pablo Saraza-Canflanca, Héctor Carrasco-Lopez, Piedad Brox, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández:
A DRV-based bit selection method for SRAM PUF key generation and its impact on ECCs. Integr. 85: 1-9 (2022) - [j3]Pablo Saraza-Canflanca, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández:
On the Impact of the Biasing History on the Characterization of Random Telegraph Noise. IEEE Trans. Instrum. Meas. 71: 1-10 (2022) - [c11]Javier Diaz-Fortuny, Pablo Saraza-Canflanca, Erik Bury, Michiel Vandemaele, Ben Kaczer, Robin Degraeve:
A Ring-Oscillator-Based Degradation Monitor Concept with Tamper Detection Capability. IRPS 2022: 1-7 - [c10]Pablo Saraza-Canflanca, Héctor Carrasco-Lopez, Andrés Santana-Andreo, Javier Diaz-Fortuny, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández:
A Smart SRAM-Cell Array for the Experimental Study of Variability Phenomena in CMOS Technologies. IRPS 2022: 3-1 - [c9]Pablo Saraza-Canflanca, Javier Martín-Martínez, Elisenda Roca, Rafael Castro-López, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández:
A systematic approach to RTN parameter fitting based on the Maximum Current Fluctuation. SMACD 2022: 1-4 - 2020
- [j2]Pablo Saraza-Canflanca, Javier Diaz-Fortuny, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández:
A robust and automated methodology for the analysis of Time-Dependent Variability at transistor level. Integr. 72: 13-20 (2020) - [j1]Javier Diaz-Fortuny, Pablo Saraza-Canflanca, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Francisco V. Fernández, Montserrat Nafría:
Flexible Setup for the Measurement of CMOS Time-Dependent Variability With Array-Based Integrated Circuits. IEEE Trans. Instrum. Meas. 69(3): 853-864 (2020) - [c8]Pablo Saraza-Canflanca, Héctor Carrasco-Lopez, Piedad Brox, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández:
Improving the reliability of SRAM-based PUFs in the presence of aging. DTIS 2020: 1-6
2010 – 2019
- 2019
- [c7]Antonio Toro-Frías, Pablo Saraza-Canflanca, Fábio Passos, Pablo Martín-Lloret, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández:
Generation of Lifetime-Aware Pareto-Optimal Fronts Using a Stochastic Reliability Simulator. DATE 2019: 78-83 - [c6]Pablo Saraza-Canflanca, Javier Diaz-Fortuny, Rafael Castro-López, Elisenda Roca Moreno, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández:
New method for the automated massive characterization of Bias Temperature Instability in CMOS transistors. DATE 2019: 150-155 - [c5]G. Pedreira, Javier Martín-Martínez, Javier Diaz-Fortuny, Pablo Saraza-Canflanca, Rosana Rodríguez, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández, Montserrat Nafría:
A New Time Efficient Methodology for the Massive Characterization of RTN in CMOS Devices. IRPS 2019: 1-5 - [c4]Pablo Saraza-Canflanca, Javier Diaz-Fortuny, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández:
TiDeVa: A Toolbox for the Automated and Robust Analysis of Time-Dependent Variability at Transistor Level. SMACD 2019: 197-200 - 2018
- [c3]Pablo Saraza-Canflanca, Javier Diaz-Fortuny, Antonio Toro-Frías, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández:
Automated Massive RTN Characterization Using a Transistor Array Chip. SMACD 2018: 29-32 - [c2]Javier Diaz-Fortuny, Pablo Saraza-Canflanca, Antonio Toro-Frías, Rafael Castro-López, Javier Martín-Martínez, Elisenda Roca, Rosana Rodríguez, Francisco V. Fernández, Montserrat Nafría:
A Model Parameter Extraction Methodology Including Time-Dependent Variability for Circuit Reliability Simulation. SMACD 2018: 53-56 - [c1]Pablo Saraza-Canflanca, D. Malagon, Fábio Passos, A. Toro, Juan Núñez, Javier Diaz-Fortuny, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández:
Design Considerations of an SRAM Array for the Statistical Validation of Time-Dependent Variability Models. SMACD 2018: 73-76
Coauthor Index
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