"New method for the automated massive characterization of Bias Temperature ..."

Pablo Saraza-Canflanca et al. (2019)

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DOI: 10.23919/DATE.2019.8715029

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Pablo Saraza-Canflanca, Javier Diaz-Fortuny, Rafael Castro-López, Elisenda Roca Moreno, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández:
New method for the automated massive characterization of Bias Temperature Instability in CMOS transistors. DATE 2019: 150-155

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