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ORCIDHolger Goebel
Person information
- affiliation: Helmut Schmidt University, Hamburg
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2010 – 2019
- 2016
[c1]Holger Goebel, Henning Siemund, Michael Kracht:
Smart education in electrical engineering with S.m.i.L.E-mobile. EDUCON 2016: 794-797- 2015
- [j6]Henning Siemund, Michael Kracht, Holger Goebel:
Realization of a Platform-Independent Web-Application for Engineering Education. Int. J. Adv. Corp. Learn. 8(1): 45-47 (2015) - 2013
- [j5]C. Ucurum, Holger Goebel
:
Quasi-static capacitance-voltage characteristics of pentacene-based metal-oxide-semiconductor structures. Microelectron. J. 44(7): 606-611 (2013) - [j4]Alexander Hofer, Roland Biberger, Günther Benstetter, Björn Wilke, Holger Göbel:
Scanning probe microscopy based electrical characterization of thin dielectric and organic semiconductor films. Microelectron. Reliab. 53(9-11): 1430-1433 (2013) - 2010
- [j3]Roland Biberger, Guenther Benstetter, Holger Goebel, Alexander Hofer:
Intermittent-contact capacitance spectroscopy - A new method for determining C(V) curves with sub-micron lateral resolution. Microelectron. Reliab. 50(9-11): 1511-1513 (2010)
2000 – 2009
- 2009
- [j2]Roland Biberger, Guenther Benstetter, Holger Goebel:
Displacement current sensor for contact and intermittent contact scanning capacitance microscopy. Microelectron. Reliab. 49(9-11): 1192-1195 (2009) - 2008
- [j1]Roland Biberger, Guenther Benstetter, Thomas Schweinböck, Peter Breitschopf, Holger Goebel:
Intermittent-contact scanning capacitance microscopy versus contact mode SCM applied to 2D dopant profiling. Microelectron. Reliab. 48(8-9): 1339-1342 (2008)
1990 – 1999
- 1993
- [b1]Holger Göbel:
Hybrid-Verfahren zur Modellierung leistungselektronischer Bauelemente. Bundeswehr University Munich, Germany, VDI-Verlag 1993, ISBN 978-3-18-144321-7, pp. 1-136
Coauthor Index
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