"Scanning probe microscopy based electrical characterization of thin ..."

Alexander Hofer et al. (2013)

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DOI: 10.1016/J.MICROREL.2013.07.086

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type: Journal Article

metadata version: 2022-12-07

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Alexander Hofer, Roland Biberger, Günther Benstetter, Björn Wilke, Holger Göbel:
Scanning probe microscopy based electrical characterization of thin dielectric and organic semiconductor films. Microelectron. Reliab. 53(9-11): 1430-1433 (2013)

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