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ORCIDDavid M. Wu
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2000 – 2009
- 2006
[c14]Zhuoyu Bao, Suriya A. Kumar, David M. Wu, Vimal K. Natarajan, Mike Lin:
A Low Cost, High Quality Embedded Array DFT Technique for High Performance Processors. DELTA 2006: 57-63- 2004
- [c13]David M. Wu, Mike Lin, Madhukar Reddy, Talal Jaber, Anil Sabbavarapu, Larry Thatcher:
An Optimized DFT and Test Pattern Generation Strategy for an Intel High Performance Microprocessor. ITC 2004: 38-47 - 2003
- [c12]David M. Wu, Mike Lin, Subhasish Mitra, Kee Sup Kim, Anil Sabbavarapu, Talal Jaber, Pete Johnson, Dale March, Greg Parrish:
H-DFT: A Hybrid DFT Architecture For Low-Cost High Quality Structural Testing. ITC 2003: 1229-1238 - 2002
- [c11]David M. Wu:
Trouble With Scan. ITC 2002: 1199-1200 - 2000
- [c10]Chao-Wen Tseng, Edward J. McCluskey, Xiaoping Shao, David M. Wu:
Cold Delay Defect Screening. VTS 2000: 183-188
1990 – 1999
- 1999
- [c9]David M. Wu:
DFT is all I can afford, who cares about Design for Yield or Design for Reliability! ITC 1999: 1141-1142 - [c8]David M. Wu:
"DFY and DFR are more important than DFT". ITC 1999: 1147 - 1992
- [c7]David M. Wu, Robert M. Swanson:
Multiple redundancy removal during test generation and synthesis. VTS 1992: 274-279 - 1991
- [c6]David M. Wu, Charles E. Radke:
Delay Test Effectiveness Evaluation of LSSD-Based VLSI Vogic Circuits. DAC 1991: 291-295 - [c5]Waisum Wong, Juin J. Liou, Jiann-Shiun Yuan, David M. Wu:
Statistical sensitivity simulation for integrating design and testing of MOSFET integrated circuits. VTS 1991: 104-108 - [c4]Jiann-Shiun Yuan, Juin J. Liou, David M. Wu:
Testing the impact of process defects on ECL power-delay performance. VTS 1991: 233-238 - [c3]David M. Wu:
An optimized delay testing technique for LSSD-based VLSI logic circuits. VTS 1991: 239-248
1980 – 1989
- 1986
- [c2]David M. Wu, Charles E. Radke, J. Paul Roth:
Statistical AC Test Coverage. ITC 1986: 538-541 - 1984
- [c1]David M. Wu, Charles E. Radke, C. C. Beh:
Improve Yield and Quality Through Testability Analysis of VLSI Circuits. ITC 1984: 713-717
Coauthor Index
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