"Statistical sensitivity simulation for integrating design and testing of ..."

Waisum Wong et al. (1991)

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DOI: 10.1109/VTEST.1991.208141

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Waisum Wong, Juin J. Liou, Jiann-Shiun Yuan, David M. Wu:
Statistical sensitivity simulation for integrating design and testing of MOSFET integrated circuits. VTS 1991: 104-108

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