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1990 – 1999
- 1991
[c7]David M. Wu, Charles E. Radke:
Delay Test Effectiveness Evaluation of LSSD-Based VLSI Vogic Circuits. DAC 1991: 291-295
1980 – 1989
- 1986
- [c6]E. Kofi Vida-Torku, James A. Monzel, Charles E. Radke:
Performance Assurance of Memories Embedded in VLSI Chips. ITC 1986: 154-160 - [c5]David M. Wu, Charles E. Radke, J. Paul Roth:
Statistical AC Test Coverage. ITC 1986: 538-541 - 1984
- [c4]David M. Wu, Charles E. Radke, C. C. Beh:
Improve Yield and Quality Through Testability Analysis of VLSI Circuits. ITC 1984: 713-717 - 1983
- [c3]E. Kofi Vida-Torku, Charles E. Radke:
Quality level and fault coverage for multichip modules. DAC 1983: 201-206 - [e2]Charles E. Radke:
Proceedings of the 20th Design Automation Conference, DAC '83, Miami Beach, Florida, USA, June 27-29, 1983. ACM/IEEE 1983, ISBN 0-8186-0026-8 [contents] - 1982
- [c2]C. C. Beh, K. H. Arya, Charles E. Radke, E. Kofi Vida-Torku:
Do Stuck Fault Models Reflect Manufacturing Defects? ITC 1982: 35-42 - [e1]James S. Crabbe, Charles E. Radke, Hillel Ofek:
Proceedings of the 19th Design Automation Conference, DAC '82, Las Vegas, Nevada, USA, June 14-16, 1982. ACM/IEEE 1982 [contents]
1970 – 1979
- 1970
- [j4]Charles E. Radke:
The use of quadratic residue research. Commun. ACM 13(2): 103-105 (1970)
1960 – 1969
- 1969
- [c1]Charles E. Radke:
A justification of, and an improvement on, a useful rule for predicting circuit-to-pin ratios. DAC 1969: 257-267 - 1966
- [j3]Charles E. Radke:
Necessary and Sufficient Conditions on Conditional Probabilities to Maximize Entropy. Inf. Control. 9(3): 279-284 (1966) - [j2]Charles E. Radke:
Merge-Sort Analysis by Matrix Techniques. IBM Syst. J. 5(4): 226-247 (1966) - 1965
- [j1]Charles E. Radke:
Enumeration of Strongly Connected Sequential Machines. Inf. Control. 8(4): 377-389 (1965)
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