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ORCIDChristian Schlünder
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2020 – today
- 2023
[c5]Christian Bogner, Christian Schlünder, Michael Waltl, Hans Reisinger, Tibor Grasser:
Modeling of NBTI Induced Threshold Voltage Shift Based on Activation Energy Maps Under Consideration of Variability. IRPS 2023: 1-7- 2022
- [c4]Christian Bogner, Tibor Grasser, Michael Waltl, Hans Reisinger, Christian Schlünder:
Efficient Evaluation of the Time-Dependent Threshold Voltage Distribution Due to NBTI Stress Using Transistor Arrays. IRPS 2022: 1-8
2010 – 2019
- 2019
- [c3]Christian Schlünder, Katja Waschneck
, Peter Rotter, Susanne Lachenmann, Hans Reisinger, Franz Ungar, Georg Georgakos:
From Device Aging Physics to Automated Circuit Reliability Sign Off. IRPS 2019: 1-12 - 2018
- [j4]Christian Schlünder, Katja Puschkarsky, Gunnar Andreas Rott, Wolfgang Gustin, Hans Reisinger:
NBTI: Experimental investigation, physical modelling, circuit aging simulations and verification. Microelectron. Reliab. 82: 1-10 (2018) - [c2]Katja Puschkarsky, Hans Reisinger, Christian Schlünder, Wolfgang Gustin, Tibor Grasser:
Fast acquisition of activation energy maps using temperature ramps for lifetime modeling of BTI. ESSDERC 2018: 218-221 - 2016
- [j3]Christian Schlünder, Jörg Berthold, Fabian Proebster, Andreas Martin, Wolfgang Gustin, Hans Reisinger:
Degradation and recovery of variability due to BTI. Microelectron. Reliab. 64: 179-184 (2016) - 2012
- [j2]Karina Rott, Hans Reisinger, Stefano Aresu, Christian Schlünder, Klaus Kölpin, Wolfgang Gustin, Tibor Grasser:
New insights on the PBTI phenomena in SiON pMOSFETs. Microelectron. Reliab. 52(9-10): 1891-1894 (2012)
2000 – 2009
- 2006
- [c1]Thomas Pompl, Christian Schlünder, Martina Hommel, Heiko Nielen, Jens Schneider:
Practical aspects of reliability analysis for IC designs. DAC 2006: 193-198 - 2005
- [j1]Christian Schlünder, Ralf Brederlow, Benno Ankele, Wolfgang Gustin, Karl Goser, Roland Thewes:
Effects of inhomogeneous negative bias temperature stress on p-channel MOSFETs of analog and RF circuits. Microelectron. Reliab. 45(1): 39-46 (2005)
Coauthor Index
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