"NBTI: Experimental investigation, physical modelling, circuit aging ..."

Christian Schlünder et al. (2018)

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DOI: 10.1016/J.MICROREL.2017.12.043

access: closed

type: Journal Article

metadata version: 2020-02-22

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Christian Schlünder, Katja Puschkarsky, Gunnar Andreas Rott, Wolfgang Gustin, Hans Reisinger:
NBTI: Experimental investigation, physical modelling, circuit aging simulations and verification. Microelectron. Reliab. 82: 1-10 (2018)

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