"Efficient Evaluation of the Time-Dependent Threshold Voltage Distribution ..."

Christian Bogner et al. (2022)

> Home

Details and statistics

DOI: 10.1109/IRPS48227.2022.9764496

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-09

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/BognerGWRS22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/BognerGWRS22
Christian Bogner, Tibor Grasser, Michael Waltl, Hans Reisinger, Christian Schlünder:
Efficient Evaluation of the Time-Dependent Threshold Voltage Distribution Due to NBTI Stress Using Transistor Arrays. IRPS 2022: 1-8

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.