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Martina Hommel

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2000 – 2009

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2006
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Oliver Aubel, Eberhard Bugiel, Dietmar Krüger, Wolfgang Hasse, Martina Hommel:
Investigation of the influence of thermal treatment on interconnect-barrier interfaces in copper metallization systems. Microelectron. Reliab. 46(5-6): 768-773 (2006)
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Thomas Pompl, Christian Schlünder, Martina Hommel, Heiko Nielen, Jens Schneider:
Practical aspects of reliability analysis for IC designs. DAC 2006: 193-198

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