• case-insensitive prefix search: default
  e.g., sig matches "SIGIR" as well as "signal"
• exact word search: append dollar sign ($) to word
  e.g., graph$ matches "graph", but not "graphics"
• boolean and: separate words by space
  e.g., codd model
• boolean or: connect words by pipe symbol (|)
  e.g., graph|network

Update May 7, 2017: Please note that we had to disable the phrase search operator (.) and the boolean not operator (-) due to technical problems. For the time being, phrase search queries will yield regular prefix search result, and search terms preceded by a minus will be interpreted as regular (positive) search terms.

found 29 matches

• 1984
• 
  Miron Abramovici, Prem R. Menon, David T. Miller:
  Critical Path Tracing: An Alternative to Fault Simulation. IEEE Des. Test 1(1): 83-93 (1984)
• 
  Robert E. Anderson:
  Linking Design&Test. IEEE Des. Test 1(2): 27-31 (1984)
• 
  Prithviraj Banerjee, Jacob A. Abraham:
  Characterization and Testing of Physical Failures in MOS Logic Circuits. IEEE Des. Test 1(3): 76-86 (1984)
• 
  Mark R. Barber:
  Fundamental Timing Problems in Testing MOS VLSI on Modern ATE. IEEE Des. Test 1(3): 90-97 (1984)
• 
  Zeev Barzilai, Leendert M. Huisman, Gabriel M. Silberman, Donald T. Tang, Lin S. Woo:
  Fast Pass-Transistor Simulation for Custom MOS Circuits. IEEE Des. Test 1(1): 71-81 (1984)
• 
  Michael J. Bending:
  Hitest: A Knowledge-Based Test Generation System. IEEE Des. Test 1(2): 83-92 (1984)
• 
  William S. Blackley, Mervyn A. Jack, James R. Jordan:
  A Digital Polarity Correlator with Built-in Self Test and Self Repair. IEEE Des. Test 1(2): 42-49 (1984)
• 
  Tom Blank:
  A Survey of Hardware Accelerators Used in Computer-Aided Design. IEEE Des. Test 1(3): 21-39 (1984)
• 
  Larry N. Dunn:
  IBM'S Engineering Design System Support for VLSI Design and Verification. IEEE Des. Test 1(1): 30-40 (1984)
• 
  David Florcik, David Low, Martin Roche:
  Prototype Debug using ATE. IEEE Des. Test 1(2): 94-99 (1984)
• 
  Francine S. Frome:
  Improving color CAD Systems for Users: Some Suggestions from Human Factors Studies. IEEE Des. Test 1(1): 18-27 (1984)
• 
  Rudy Garcia:
  The Fairchild Sentry 50 Tester: Establishing New ATE Performance Limits. IEEE Des. Test 1(2): 101-109 (1984)
• 
  W. R. Heller, C. George Hsi, Wadie F. Mikhaill:
  Wirability-designing wiring space for chips and chip packages. IEEE Des. Test 1(3): 43-51 (1984)
• 
  Dwight D. Hill:
  Icon: A Tool for Design at Schematic, Virtual Grid, and Layout Levels. IEEE Des. Test 1(4): 53-60 (1984)
• 
  Nikos Kanopoulos, G. Thomas Mitchell:
  Design for Testability and Self-Testing Approaches for Bit-Serial signal Processors. IEEE Des. Test 1(2): 52-59 (1984)
• 
  Jin H. Kim, John McDermott, Daniel P. Siewiorek:
  Exploiting Domain Knowledge in IC Cell Layout. IEEE Des. Test 1(3): 52-64 (1984)
• 
  Thaddeus J. Kowalski, Donald E. Thomas:
  The VLSI Design Automation Assistant: An IBM System/370 Design. IEEE Des. Test 1(1): 60-69 (1984)
• 
  Robert C. Kroeger:
  Testability Emphasis in the General Electric A/VLSI Program. IEEE Des. Test 1(2): 61-65 (1984)
• 
  John R. Kuban, William C. Bruce:
  Self-Testing the Motorola MC6804P2. IEEE Des. Test 1(2): 33-41 (1984)
• 
  Johnny J. LeBlanc:
  LOCST: A Built-In Self-Test Technique. IEEE Des. Test 1(4): 45-52 (1984)
• 
  Yashwant K. Malaiya, Ramesh Narayanaswamy:
  Modeling and Testing for Timing Faults in Synchronous Sequential Circuits. IEEE Des. Test 1(4): 62-74 (1984)
• 
  Akira Motohara, Hideo Fujiwara:
  Design for Testability for Complete Test Coverage. IEEE Des. Test 1(4): 25-32 (1984)
• 
  Hillel Ofek:
  Guest Editor's Introduction Design Automation. IEEE Des. Test 1(1): 16-17 (1984)
• 
  Alice C. Parker:
  Automated Synthesis of Digital systems. IEEE Des. Test 1(4): 75-81 (1984)
• 
  Chantal Robach, Philippe Malecha, Gilles Michel:
  CATA: A Computer-Aided Test Analysis System. IEEE Des. Test 1(2): 68-79 (1984)
• 
  Charles W. Rose, Greg M. Ordy, Paul J. Drongowski:
  N.mPc: A Study in University-Industry Technology Transfer. IEEE Des. Test 1(1): 44-56 (1984)
• 
  Steve Sapiro:
  The electronic workstation-an overview. IEEE Des. Test 1(4): 33-41 (1984)
• 
  Richard M. Sedmak, Donald E. Thomas:
  Probing the State of the Art. IEEE Des. Test 1(3): 18-19 (1984)
• 
  Ronald L. Wadsack:
  Design Verification and Testing of the WE 32100 CPUs. IEEE Des. Test 1(3): 66-75 (1984)