"A 30-ns 64-Mb DRAM with built-in self-test and self-repair function."

Akira Tanabe et al. (1992)

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DOI: 10.1109/4.165332

access: closed

type: Journal Article

metadata version: 2025-02-03

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Akira Tanabe, Toshio Takeshima, Hiroki Koike, Yoshiharu Aimoto, Masahide Takada, Toshiyuki Ishijima, Naoki Kasai, Hiromitsu Hada, Kentaro Shibahara, Takemitsu Kunio, Takaho Tanigawa, Takanori Saeki, Masato Sakao, Hidenobu Miyamoto, Hiroshi Nozue, Shuichi Ohya, Tatsunori Murotani, Kuniaki Koyama, Takashi Okuda:
A 30-ns 64-Mb DRAM with built-in self-test and self-repair function. IEEE J. Solid State Circuits 27(11): 1525-1533 (1992)

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