"Test-Per-Clock Logic BIST with Semi-Deterministic Test Patterns and ..."

Ondrej Novák et al. (2004)

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DOI: 10.1023/B:JETT.0000009317.31947.C8

access: closed

type: Journal Article

metadata version: 2020-09-11

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Ondrej Novák, Zdenek Plíva, Jiri Nosek, Andrzej Hlawiczka, Tomasz Garbolino, Krzysztof Gucwa:
Test-Per-Clock Logic BIST with Semi-Deterministic Test Patterns and Zero-Aliasing Compactor. J. Electron. Test. 20(1): 109-122 (2004)

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