"Modeling and Testing of SRAM for New Failure Mechanisms Due to Process ..."

Qikai Chen et al. (2005)

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DOI: 10.1109/VTS.2005.58

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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Qikai Chen, Hamid Mahmoodi-Meimand, Swarup Bhunia, Kaushik Roy:
Modeling and Testing of SRAM for New Failure Mechanisms Due to Process Variations in Nanoscale CMOS. VTS 2005: 292-297

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