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2020 – today
- 2023
[c12]Wenchao Weng
, Qikai Chen, Yu Dai, Jingyang Chen, Dongliang Chen:
Multi-scale Fusion Dynamic Graph Neural Network For Traffic Flow Prediction. ADMIT 2023: 85-90
2000 – 2009
- 2007
- [c11]Saibal Mukhopadhyay, Qikai Chen, Kaushik Roy:
Memories in Scaled Technologies: A Review of Process Induced Failures, Test Methodologies, and Fault Tolerance. DDECS 2007: 69-74 - [c10]Qikai Chen, Arjun Guha, Kaushik Roy:
An Accurate Analytical SNM Modeling Technique for SRAMs Based on Butterworth Filter Function. VLSI Design 2007: 615-620 - 2006
- [c9]Saibal Mukhopadhyay, Amit Agarwal, Qikai Chen, Kaushik Roy:
SRAMs in Scaled Technologies under Process Variations: Failure Mechanisms, Test & Variation Tolerant Design. CICC 2006: 547-554 - [c8]Qikai Chen, Saibal Mukhopadhyay, Aditya Bansal, Kaushik Roy:
Circuit-aware device design methodology for nanometer technologies: a case study for low power SRAM design. DATE 2006: 983-988 - [c7]Arijit Raychowdhury, Xuanyao Fong, Qikai Chen, Kaushik Roy:
Analysis of super cut-off transistors for ultralow power digital logic circuits. ISLPED 2006: 2-7 - [c6]Qikai Chen, Mesut Meterelliyoz, Kaushik Roy:
A CMOS Thermal Sensor and Its Applications in Temperature Adaptive Design. ISQED 2006: 243-248 - 2005
- [j1]Qikai Chen, Hamid Mahmoodi-Meimand, Swarup Bhunia, Kaushik Roy:
Efficient testing of SRAM with optimized march sequences and a novel DFT technique for emerging failures due to process variations. IEEE Trans. Very Large Scale Integr. Syst. 13(11): 1286-1295 (2005) - [c5]Swarup Bhunia, Nilanjan Banerjee, Qikai Chen, Hamid Mahmoodi-Meimand, Kaushik Roy:
A novel synthesis approach for active leakage power reduction using dynamic supply gating. DAC 2005: 479-484 - [c4]Matthew Cooke, Hamid Mahmoodi-Meimand, Qikai Chen, Kaushik Roy:
Energy recovery clocked dynamic logic. ACM Great Lakes Symposium on VLSI 2005: 468-471 - [c3]Patrick Ndai, Amit Agarwal, Qikai Chen, Kaushik Roy:
A Soft Error Monitor Using Switching Current Detection. ICCD 2005: 185-192 - [c2]Qikai Chen, Saibal Mukhopadhyay, Hamid Mahmoodi, Kaushik Roy:
Process Variation Tolerant Online Current Monitor for Robust Systems. IOLTS 2005: 171-176 - [c1]Qikai Chen, Hamid Mahmoodi-Meimand, Swarup Bhunia, Kaushik Roy:
Modeling and Testing of SRAM for New Failure Mechanisms Due to Process Variations in Nanoscale CMOS. VTS 2005: 292-297
Coauthor Index
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