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ORCIDJon C. Muzio
Person information
- affiliation: University of Victoria, Canada
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2010 – 2019
- 2011
[j29]Jacqueline E. Rice, Jon C. Muzio, Neil Anderson:
New Considerations for Spectral Classification of Boolean Switching Functions. VLSI Design 2011: 356137:1-356137:9 (2011)
2000 – 2009
- 2007
- [c24]Hosna Jabbari
, Jon C. Muzio, Lin Sun:
A New Class of Cellular Automata. DSD 2007: 331-338 - 2006
- [c23]Jing Zhong, Jon C. Muzio:
Analyzing Fault Models for Reversible Logic Circuits. IEEE Congress on Evolutionary Computation 2006: 2422-2427 - 2005
- [c22]Jacqueline E. Rice, Jon C. Muzio:
A Characterization of Antisymmetry in Boolean and Multi-Valued Functions. ISMVL 2005: 270-275 - 2004
- [c21]Jing Zhong, Jon C. Muzio:
An Investigation of Non-Linear Machines as PRPGs in BIST. ESA/VLSI 2004: 360-366 - [c20]Laurence Tianruo Yang, Jon C. Muzio:
Testing Methodologies for Embedded Systems and Systems-on-Chip. ICESS 2004: 15-24 - 2002
- [c19]Laurence Tianruo Yang, Jon C. Muzio:
Redundant transformations for BIST testability metrics-based data path allocation. APCCAS (2) 2002: 119-123 - [c18]Jacqueline E. Rice, Jon C. Muzio:
Use of the Autocorrelation Function in the Classification of Switching Functions. DSD 2002: 244-251 - [c17]Micaela Serra, Jon C. Muzio:
The IT Support for Acquired Brain Injury Patients - the Design and Evaluation of a New Software Package. HICSS 2002: 135 - [c16]Laurence Tianruo Yang, Jon C. Muzio:
Introducing redundant transformations for high level built-in self-testable synthesis. ICECS 2002: 475-479 - [c15]Jacqueline E. Rice, Jon C. Muzio:
Antisymmetries in the realization of Boolean functions. ISCAS (4) 2002: 69-72 - 2001
- [c14]Laurence Tianruo Yang, Jon C. Muzio:
An Integrated High-Level Test Synthesis for Built-in Self-Testable Designs. SBCCI 2001: 115-123 - 2000
- [j28]Elena Dubrova, Jon C. Muzio:
Easily Testable Multiple-Valued Logic Circuits Derived from Reed-Muller Circuits. IEEE Trans. Computers 49(11): 1285-1289 (2000) - [c13]Elena Dubrova, Peeter Ellervee, D. Michael Miller, Jon C. Muzio:
TOP: An Algorithm for Three-Level Optimization of PLDs. DATE 2000: 751
1990 – 1999
- 1999
- [j27]Kevin Cattell, Shujian Zhang, Micaela Serra, Jon C. Muzio:
2-by-n Hybrid Cellular Automata with Regular Configuration: Theory and Application. IEEE Trans. Computers 48(3): 285-295 (1999) - [c12]Micaela Serra, E. Wang, Jon C. Muzio:
A Multimedia Virtual Lab for Digital Logic Design. MSE 1999: 39-40 - 1997
- [j26]Kevin Cattell, Jon C. Muzio:
Partial Symmetry in Cellular Automata Rule Vectors. J. Electron. Test. 11(2): 187-190 (1997) - [c11]Elena Dubrova, Jon C. Muzio, Bernhard von Stengel:
Finding Composition Trees for Multiple-Valued Functions. ISMVL 1997: 19-26 - 1996
- [j25]David Wessels, Jon C. Muzio:
The dangers of simplistic delay models. J. Electron. Test. 8(1): 61-69 (1996) - [j24]Kevin Cattell, Jon C. Muzio:
Analysis of One-Dimensional Linear Hybrid Cellular Automata over GF(q). IEEE Trans. Computers 45(7): 782-792 (1996) - [j23]Kevin Cattell, Jon C. Muzio:
Synthesis of one-dimensional linear hybrid cellular automata. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 15(3): 325-335 (1996) - [j22]Shujian Zhang, D. Michael Miller, Jon C. Muzio:
Notes on "Complexity of the lookup-table minimization problem for FPGA technology mapping". IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 15(12): 1588-1590 (1996) - [c10]Elena Dubrova, Jon C. Muzio:
Testability of Generalized Multiple-Valued Reed-Muller Circuits. ISMVL 1996: 56-61 - 1995
- [j21]Shujian Zhang, Jon C. Muzio:
Evaluating the safety of self-checking circuits. J. Electron. Test. 6(2): 243-253 (1995) - [j20]Shujian Zhang, Rod Byrne, Jon C. Muzio, D. Michael Miller:
Quantitative analysis for linear hybrid cellular automata and LFSR as built-in self-test generators for sequential faults. J. Electron. Test. 7(3): 209-221 (1995) - [c9]David Wessels, Jon C. Muzio:
Analyzing and improving delay defect tolerance in pipelined combinational circuits. DFT 1995: 181-188 - [c8]Elena Dubrova, Dilian Gurov, Jon C. Muzio:
The Evaluation of Full Sensitivity for Test Generation in MVL Circuits. ISMVL 1995: 104-111 - 1994
- [c7]Shujian Zhang, Rod Byrne, Jon C. Muzio, D. Michael Miller:
Why Cellular Automata are better than LFSRs as Built-in Self-test Generators for Sequential-type Faults. ISCAS 1994: 69-72 - [c6]Elena Dubrova, Dilian Gurov, Jon C. Muzio:
Full Sensitivity and Test Generation for Multiple-Valued Logic Circuits. ISMVL 1994: 284-288 - 1993
- [j19]Chao Feng, Jon C. Muzio, Fabrizio Lombardi:
On the testability of array structures for FFT computation. J. Electron. Test. 4(3): 215-224 (1993) - [c5]David Wessels, Jon C. Muzio:
Probabilistic Identification of Critical Components for Circuit Delays. DFT 1993: 215-222 - 1992
- [j18]Patrick Kam Lui, Jon C. Muzio:
Boolean Matrix Transforms for the Minimization of Modulo-2 Canonical Expansions. IEEE Trans. Computers 41(3): 342-348 (1992) - [c4]David Wessels, Jon C. Muzio:
Concurrent Checking and Unidirectional Errors in Multiple-Valued Circuits. ISMVL 1992: 166-173 - 1991
- [j17]Patrick Kam Lui, Jon C. Muzio:
Constrained parity testing. J. Electron. Test. 2(3): 279-291 (1991) - 1990
- [j16]Micaela Serra, Terry Slater, Jon C. Muzio, D. Michael Miller:
The analysis of one-dimensional linear cellular automata and their aliasing properties. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 9(7): 767-778 (1990) - [c3]Jon C. Muzio:
Concerning the Maximum Size of the Terms in the Realization of Symmetric Functions. ISMVL 1990: 292-299 - [c2]Fabrizio Lombardi, Yinan N. Shen, Jon C. Muzio:
On the testability of array structures for FFT computation. SPDP 1990: 519-522
1980 – 1989
- 1988
- [j15]Micaela Serra, Jon C. Muzio:
Space compaction for multiple-output circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 7(10): 1105-1113 (1988) - 1987
- [j14]Micaela Serra, Jon C. Muzio:
Testing Programmable Logic Arrays by Sum of Syndromes. IEEE Trans. Computers 36(9): 1097-1101 (1987) - 1984
- [j13]D. Michael Miller, Jon C. Muzio:
Spectral Fault Signatures for Single Stuck-At Faults in Combinational Networks. IEEE Trans. Computers 33(8): 765-769 (1984) - 1983
- [j12]D. Michael Miller, Jon C. Muzio:
Spectral Fault Signatures for Internally Unate Combinational Networks. IEEE Trans. Computers 32(11): 1058-1062 (1983) - 1980
- [j11]D. Michael Miller, Jon C. Muzio:
A class of two-place three-valued unary generators. Notre Dame J. Formal Log. 21(1): 148-154 (1980) - [j10]Jon C. Muzio:
Composite Spectra and the Analysis of Switching Circuits. IEEE Trans. Computers 29(8): 750-753 (1980)
1970 – 1979
- 1979
- [j9]Jon C. Muzio:
Classes of universal decision elements using negative substitutions. Notre Dame J. Formal Log. 20(2): 314-320 (1979) - 1978
- [j8]Jon C. Muzio:
A note concerning a sole sufficient operator. Notre Dame J. Formal Log. 19(3): 419-420 (1978) - [c1]Jon C. Muzio, T. C. Wesselkamper:
Generalized finite Post algebras. MVL 1978: 235-241 - 1977
- [j7]Jon C. Muzio:
A prefix operator for a switching algebra. Int. J. Parallel Program. 6(2): 151-163 (1977) - [j6]J. A. Bate, Jon C. Muzio:
Three Cell Structures for Ternary Cellular Arrays. IEEE Trans. Computers 26(12): 1191-1202 (1977) - 1976
- [j5]Jon C. Muzio:
Concerning Completeness and Abelian Semigroups. Math. Log. Q. 22(1): 85-86 (1976) - [j4]Jon C. Muzio:
A complete classification of three-place functors in two-valued logic. Notre Dame J. Formal Log. 17(3): 429-437 (1976) - [j3]D. Michael Miller, Jon C. Muzio:
A ternary universal decision element. Notre Dame J. Formal Log. 17(4): 632-637 (1976) - 1974
- [j2]Jon C. Muzio:
Partial universal decision elements. Notre Dame J. Formal Log. 15(1): 133-140 (1974) - 1973
- [j1]Jon C. Muzio:
The cosubstitution condition. Notre Dame J. Formal Log. 14(1): 87-94 (1973)
Coauthor Index
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