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2000 – 2009
- 2008
[j6]Thomas Noulis
, Stylianos Siskos, Gérard Sarrabayrouse, Laurent Bary:
Advanced Low-Noise X-Ray Readout ASIC for Radiation Sensor Interfaces. IEEE Trans. Circuits Syst. I Regul. Pap. 55-I(7): 1854-1862 (2008)- 2007
- [j5]Yuan Gao, Nicolas Guitard, Christophe Salamero, Marise Bafleur, Laurent Bary, Laurent Escotte, Patrick Gueulle, Lionel Lescouzères:
Identification of the physical signatures of CDM induced latent defects into a DC-DC converter using low frequency noise measurements. Microelectron. Reliab. 47(9-11): 1456-1461 (2007) - [j4]Jinyu Jason Ruan, Nicolas Nolhier, Marise Bafleur, Laurent Bary, Fabio Coccetti, T. Lisec, Robert Plana:
Electrostatic discharge failure analysis of capacitive RF MEMS switches. Microelectron. Reliab. 47(9-11): 1818-1822 (2007) - 2005
- [j3]S. Mellé, D. De Conto, L. Mazenq, David Dubuc, B. Poussard, C. Bordas, Katja Grenier, Laurent Bary, Olivier Vendier, J. L. Muraro:
Failure predictive model of capacitive RF-MEMS. Microelectron. Reliab. 45(9-11): 1770-1775 (2005) - 2004
- [j2]David Dubuc, M. Saddaoui, S. Mellé, F. Flourens, L. Rabbia, Benoit Ducarouge, Katja Grenier, Patrick Pons, Ali Boukabache, Laurent Bary:
Smart MEMS concept for high secure RF and millimeterwave communications. Microelectron. Reliab. 44(6): 899-907 (2004) - [j1]Nicolas Guitard, David Trémouilles, Marise Bafleur, Laurent Escotte, Laurent Bary, Philippe Perdu, Gérard Sarrabayrouse, Nicolas Nolhier, Roberto Reyna-Rojas:
Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications. Microelectron. Reliab. 44(9-11): 1781-1786 (2004)
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