"Low Frequency Noise Measurements for ESD Latent Defect Detection in High ..."

Nicolas Guitard et al. (2004)

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DOI: 10.1016/J.MICROREL.2004.07.106

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type: Journal Article

metadata version: 2020-02-22

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Nicolas Guitard, David Trémouilles, Marise Bafleur, Laurent Escotte, Laurent Bary, Philippe Perdu, Gérard Sarrabayrouse, Nicolas Nolhier, Roberto Reyna-Rojas:
Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications. Microelectron. Reliab. 44(9-11): 1781-1786 (2004)

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