default search action

combined dblp search
author search
venue search
publication search

ask others

Jung-Eun Seok

Jung Eun Seok

> Home > Persons

This is just a disambiguation page, and is not intended to be the bibliography of an actual person. Any publication listed on this page has not been assigned to an actual author yet. If you know the true author of one of the publications listed below, you are welcome to contact us.

Person information

Refine list

refinements active!

zoomed in on ?? of ?? records

view refined list in

export refined list as

showing all ?? records

Journal Articles

see FAQ

What is the meaning of the colors in the publication lists?

2018
[j3]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/KimLKSL18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/KimLKSL18
Gang-Jun Kim, Nam-Hyun Lee, Jongkyun Kim, Jung Eun Seok, Yunsung Lee:
Effect of DC/AC stress on the reliability of cell capacitor in DRAM. Microelectron. Reliab. 88-90: 179-182 (2018)
[j2]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/KimLKLSL18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/KimLKLSL18
Jongkyun Kim, Namhyun Lee, Gang-Jun Kim, Young-Yun Lee, Jung-Eun Seok, Yunsung Lee:
Effect of OFF-state stress on reliability of nMOSFET in SWD circuits of DRAM. Microelectron. Reliab. 88-90: 183-185 (2018)
2008
[j1]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/SeokKSHK08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/SeokKSHK08
Jung-Eun Seok, Hyun-Joo Kim, Jae-Yong Seo, Sam-jin Hwang, Byung-Heon Kwak:
Optimization of gate poly TAB size and reliability on short channel pMOSFET. Microelectron. Reliab. 48(8-9): 1185-1188 (2008)

Conference and Workshop Papers

see FAQ

What is the meaning of the colors in the publication lists?

2019
[c1]
- view
  authority control:
- export record
  dblp key:
  - conf/irps/LeeKSKS19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/LeeKSKS19
Nam-Hyun Lee, Jongkyun Kim, Donghee Son, Kangjun Kim, Jung Eun Seok:
Comprehensive Study for OFF-State Hot Carrier Degrdation of Scaled nMOSFETs in DRAM. IRPS 2019: 1-4

Coauthor Index

see FAQ

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.