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Jongkyun Kim

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2020 – today

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2021
[c2]
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  dblp key:
  - conf/irps/SonKKLKP21
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Donghee Son, Gang-Jun Kim, Jongkyun Kim, Nam-Hyun Lee, Kijin Kim, Sangwoo Pae:
Effect of High Temperature on Recovery of Hot Carrier Degradation of scaled nMOSFETs in DRAM. IRPS 2021: 1-4

2010 – 2019

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2019
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Nam-Hyun Lee, Jongkyun Kim, Donghee Son, Kangjun Kim, Jung Eun Seok:
Comprehensive Study for OFF-State Hot Carrier Degrdation of Scaled nMOSFETs in DRAM. IRPS 2019: 1-4
2018
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Gang-Jun Kim, Nam-Hyun Lee, Jongkyun Kim, Jung Eun Seok, Yunsung Lee:
Effect of DC/AC stress on the reliability of cell capacitor in DRAM. Microelectron. Reliab. 88-90: 179-182 (2018)
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Jongkyun Kim, Namhyun Lee, Gang-Jun Kim, Young-Yun Lee, Jung-Eun Seok, Yunsung Lee:
Effect of OFF-state stress on reliability of nMOSFET in SWD circuits of DRAM. Microelectron. Reliab. 88-90: 183-185 (2018)
2013
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  - journals/ieiceee/ParkK13
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Youngcheol Park, Jongkyun Kim:
A small-sized class-J power amplifier from combined multi-harmonic voltage reflection functions. IEICE Electron. Express 10(8): 20130171 (2013)

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