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ORCIDJamil Kawa
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2020 – today
- 2024
[j4]Abdelrahman G. Qoutb, Jamil Kawa, Eby G. Friedman:
Test Modules for Enhanced Testability of Single Flux Quantum Integrated Circuits. J. Electron. Test. 40(5): 595-602 (2024)- [c22]Rouwaida Kanj, Jamil Kawa:
A 5T Half-SRAM Design for Cold CMOS Physical Unclonable Function Applications and Beyond. ISQED 2024: 1-8 - 2022
- [c21]Giulia Meuli, Vinicius N. Possani, Rajinder Singh, Siang-Yun Lee
, Alessandro Tempia Calvino, Dewmini Sudara Marakkalage, Patrick Vuillod, Luca G. Amarù, Scott Chase, Jamil Kawa, Giovanni De Micheli:
Majority-based Design Flow for AQFP Superconducting Family. DATE 2022: 34-39
2010 – 2019
- 2017
- [c20]Prashant Dubey, Kritika Aditya, Ankur Srivastava, Amit Khanuja, Jamil Kawa, Thu Nguyen:
A 0.42V high bandwidth synthesizable parallel access smart memory fabric for computer vision. ISCAS 2017: 1-4 - 2010
- [j3]Arthur Nieuwoudt, Jamil Kawa, Yehia Massoud:
Crosstalk-Induced Delay, Noise, and Interconnect Planarization Implications of Fill Metal in Nanoscale Process Technology. IEEE Trans. Very Large Scale Integr. Syst. 18(3): 378-391 (2010) - [c19]Nagaraj Ns, Juan C. Rey, Jamil Kawa, Robert C. Aitken, Christian Lütkemeyer, Vijay Pitchumani, Andrzej J. Strojwas, Steve Trimberger:
Who solves the variability problem? DAC 2010: 218-219
2000 – 2009
- 2008
- [c18]Yongqiang Lu, Qing Su, Jamil Kawa:
An innovative Steiner tree based approach for polygon partitioning. ASP-DAC 2008: 358-363 - [c17]Arthur Nieuwoudt, Jamil Kawa, Yehia Massoud:
Automated design of tunable impedance matching networks for reconfigurable wireless applications. DAC 2008: 498-503 - [c16]Arthur Nieuwoudt, Jamil Kawa, Yehia Massoud:
Impact of dummy filling techniques on interconnect capacitance and planarization in nano-scale process technology. ACM Great Lakes Symposium on VLSI 2008: 151-154 - [c15]Arthur Nieuwoudt, Jamil Kawa, Yehia Massoud:
Robust reconfigurable filter design using analytic variability quantification techniques. ICCAD 2008: 765-770 - [c14]Qing Su, Charles C. Chiang, Jamil Kawa:
Hotspot Based Yield Prediction with Consideration of Correlations. ISQED 2008: 338-343 - [c13]Arthur Nieuwoudt, Jamil Kawa, Yehia Massoud:
Investigating the Impact of Fill Metal on Crosstalk-Induced Delay and Noise. ISQED 2008: 724-729 - 2007
- [b1]Charles C. Chiang, Jamil Kawa:
Design for Manufacturability and Yield for Nano-Scale CMOS. Series on Integrated Circuits and Systems, Springer 2007, ISBN 978-1-4020-5187-6, pp. 1-254 - [c12]Jamil Kawa, Charles C. Chiang:
DFM issues for 65nm and beyond. ACM Great Lakes Symposium on VLSI 2007: 318-322 - 2006
- [j2]Qing Su, Jamil Kawa, Charles C. Chiang, Yehia Massoud:
Accurate modeling of substrate resistive coupling for floating substrates. ACM Trans. Design Autom. Electr. Syst. 11(1): 44-51 (2006) - [c11]Charles C. Chiang, Jamil Kawa:
Three DFM Challenges: Random Defects, Thickness Variation, and Printability Variation. APCCAS 2006: 1099-1102 - [c10]Jamil Kawa, Charles C. Chiang, Raul Camposano:
EDA Challenges in Nano-scale Technology. CICC 2006: 845-851 - [c9]Jianfeng Luo, Subarna Sinha, Qing Su, Jamil Kawa, Charles C. Chiang:
An IC manufacturing yield model considering intra-die variations. DAC 2006: 749-754 - [c8]Dan Page, Jamil Kawa, Charles C. Chiang:
DFM: swimming upstream. ACM Great Lakes Symposium on VLSI 2006: 1 - 2005
- [c7]Jamil Kawa, Jackie Snyder:
Custom circuits. CICC 2005: 496-497 - [c6]Jamil Kawa, Yuhua Cheng, Hiroshi Iwai, Richard Goering, Michael Campbell, Raul Camposano, Jon Fields, Patrick Lin, Steve Lloyd, Joseph Sawicki, Ed Wan:
Foundries, EDA vendors, and designers: who shoulders the blame when a design doesn't work in the nano-scale and wireless era? CICC 2005: 618-619 - [c5]Jianfeng Luo, Qing Su, Charles C. Chiang, Jamil Kawa:
A layout dependent full-chip copper electroplating topography model. ICCAD 2005: 133-140 - [c4]Xin Wang, Charles C. Chiang, Jamil Kawa, Qing Su:
A Min-Variance Iterative Method for Fast Smart Dummy Feature Density Assignment in Chemical-Mechanical Polishing. ISQED 2005: 258-263 - 2004
- [c3]Narendra V. Shenoy, Jamil Kawa, Raul Camposano:
Design automation for mask programmable fabrics. DAC 2004: 192-197 - [c2]Bo-Kyung Choi, Charles C. Chiang, Jamil Kawa, Majid Sarrafzadeh:
Routing resources consumption on M-arch and X-arch. ISCAS (5) 2004: 73-76 - 2002
- [j1]Yehia Massoud, Steve S. Majors, Jamil Kawa, Tareq Bustami, Don MacMillen, Jacob K. White:
Managing on-chip inductive effects. IEEE Trans. Very Large Scale Integr. Syst. 10(6): 789-798 (2002) - 2001
- [c1]Yehia Massoud, Jamil Kawa, Don MacMillen, Jacob White:
Modeling and Analysis of Differential Signaling for Minimizing Inductive Cross-Talk. DAC 2001: 804-809
Coauthor Index
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