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2020 – today
- 2022
[c8]Ondrej Kachman, Jakub Findura, Marcel Baláz, Gábor Gyepes, Libor Majer, Marian Vojs:
Intelligent Monitoring System for Universal Data Collection and Analysis. RADIOELEKTRONIKA 2022: 1-6
2010 – 2019
- 2014
- [j2]Gábor Gyepes, Viera Stopjaková
, Daniel Arbet, Libor Majer, Juraj Brenkus:
A new IDDT test approach and its efficiency in covering resistive opens in SRAM arrays. Microprocess. Microsystems 38(5): 359-367 (2014) - [j1]Daniel Arbet, Viera Stopjaková, Juraj Brenkus, Gábor Gyepes, Martin Kovác, Libor Majer:
BIST architecture for oscillation test of analog ICs and investigation of test hardware influence. Microelectron. Reliab. 54(5): 985-992 (2014) - [c7]Juraj Brenkus, Viera Stopjaková, Daniel Arbet, Gábor Gyepes, Libor Majer:
A novel impedance calculation method and its time efficiency evaluation. DDECS 2014: 99-103 - 2013
- [c6]Juraj Brenkus, Viera Stopjaková, Gábor Gyepes:
Numerical method for DC fault analysis simplification and simulation time reduction. DDECS 2013: 170-174 - [c5]Daniel Arbet, Gabriel Nagy, Viera Stopjaková, Gábor Gyepes:
Efficiency of oscillation-based BIST in 90nm CMOS active analog filters. DDECS 2013: 263-266 - 2012
- [c4]Gábor Gyepes, Daniel Arbet, Juraj Brenkus, Viera Stopjaková:
Application of IDDT test towards increasing SRAM reliability in nanometer technologies. DDECS 2012: 167-170 - [c3]Daniel Arbet, Gábor Gyepes, Juraj Brenkus, Viera Stopjaková:
OBIST strategy versus parametric test - Efficiency in covering catastrophic faults in active analog filters. DDECS 2012: 193-194 - 2011
- [c2]Daniel Arbet, Juraj Brenkus, Gábor Gyepes, Viera Stopjaková:
Increasing the efficiency of analog OBIST using on-chip compensation of technology variations. DDECS 2011: 71-74 - [c1]Gábor Gyepes, Juraj Brenkus, Daniel Arbet, Viera Stopjaková:
Comparison of iddt test efficiency in covering opens in SRAMs realised in two different technologies. DDECS 2011: 395-396
Coauthor Index
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