"Application of IDDT test towards increasing SRAM reliability in nanometer ..."

Gábor Gyepes et al. (2012)

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DOI: 10.1109/DDECS.2012.6219046

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Gábor Gyepes, Daniel Arbet, Juraj Brenkus, Viera Stopjaková:
Application of IDDT test towards increasing SRAM reliability in nanometer technologies. DDECS 2012: 167-170

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