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ORCIDSang Jeen Hong
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2020 – today
- 2023
[j6]Jeong Eun Choi
, Da Hoon Seol, Chan Young Kim, Sang Jeen Hong:
Generative Adversarial Network-Based Fault Detection in Semiconductor Equipment with Class-Imbalanced Data. Sensors 23(4): 1889 (2023)- [j5]Chansu Han, Yoonsung Koo, Jaehwan Kim, Kwangwook Choi, Sang Jeen Hong:
Wafer Type Ion Energy Monitoring Sensor for Plasma Diagnosis. Sensors 23(5): 2410 (2023)
2010 – 2019
- 2014
- [j4]Muhammad Zeeshan Arshad, Javeria Muhammad Nawaz, Sang Jeen Hong:
Fault Detection in the Semiconductor Etch Process Using the Seasonal Autoregressive Integrated Moving Average Modeling. J. Inf. Process. Syst. 10(3): 429-442 (2014) - 2013
- [c7]Javeria Muhammad Nawaz, Muhammad Zeeshan Arshad, Sang Jeen Hong:
Time Series Fault Prediction in Semiconductor Equipment Using Recurrent Neural Network. ISNN (2) 2013: 463-472 - 2010
- [c6]Sung-Ik Jeon, Seung-Gyun Kim, Sang Jeen Hong, Seung Soo Han:
Endpoint Detection of SiO2 Plasma Etching Using Expanded Hidden Markov Model. ISNN (2) 2010: 464-471
2000 – 2009
- 2009
- [c5]Hyun-Soo Kim, Sang Jeen Hong, Seung Soo Han:
A comparison and analysis of genetic algorithm and particle swarm optimization using neural network models for high efficiency solar cell fabrication processes. FUZZ-IEEE 2009: 1879-1884 - 2007
- [c4]SungJoon Lee, A. Pandey, DongSeop Kim, Ajeet Rohatgi, Gary S. May, Sang Jeen Hong, Seung Soo Han:
Characterization and Optimization of the Contact Formation for High-Performance Silicon Solar Cells. ISNN (3) 2007: 246-251 - 2006
- [c3]Seung Soo Han, Dong Sun Seo, Sang Jeen Hong:
Modeling and Characterization of Plasma Processes Using Modular Neural Network. ISNN (2) 2006: 1014-1019 - [c2]Byungwhan Kim, Sooyoun Kim, Sang Jeen Hong:
Recognition of Plasma-Induced X-Ray Photoelectron Spectroscopy Fault Pattern Using Wavelet and Neural Network. ISNN (2) 2006: 1036-1042 - 2005
- [j3]SungJoon Lee, Dea-Wha Soh, Sang Jeen Hong:
Sensitivity Analysis of Plasma Charge-up Monitoring Sensor. J. Inform. and Commun. Convergence Engineering 3(4): 187-190 (2005) - [j2]Sei-Young Mun, Gwang-Beom Kim, Dea-Wha Soh, Sang Jeen Hong:
Characterization of Negative Photoresist Processing by Statistical Design of Experiment (DOE). J. Inform. and Commun. Convergence Engineering 3(4): 191-194 (2005) - [j1]Sang Jeen Hong, Gary S. May:
Neural-Network-Based Sensor Fusion of Optical Emission and Mass Spectroscopy Data for Real-Time Fault Detection in Reactive Ion Etching. IEEE Trans. Ind. Electron. 52(4): 1063-1072 (2005) - [c1]Dong-Chul Park, Duc-Hoai Nguyen, Sang Jeen Hong, Yunsik Lee:
Equalization of a Wireless ATM Channel with Simplified Complex Bilinear Recurrent Neural Network. ICNC (1) 2005: 1113-1116
Coauthor Index
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